Abstract

The reflection scanning microscope provides a method for producing a scanned point light source as well as a system for collecting the light that is reflected by the sample. Theoretical calculations of the coupled intensity between the natural propagation mode of the optical fiber and the light reflected by the sample are presented as a function of the fiber–sample distance and of the orientation of the sample with respect to the fiber. Theoretical scans of the fiber above a reflection step, in constant distance and intensity modes, are presented as a function of the fiber–sample distance. In order to compare the theoretical scans with our experimental results, we present reflection scanning microscope images of a standard sample as a function of the fiber–sample distance.

© 1993 Optical Society of America

Reflection scanning microscopy

N. Cerre, F. De Fornel, and J. P. Goudonnet
Appl. Opt. 31(7) 903-908 (1992)

Spatial spectroscopy with the reflection scanning microscope

N. Cerre, F. de Fornel, J. P. Goudonnet, P. R. Ladan, and Ph. Guerrin
J. Opt. Soc. Am. A 13(7) 1357-1361 (1996)

Probes for scanning tunneling optical microscopy: a theoretical comparison

D. Van Labeke and D. Barchiesi
J. Opt. Soc. Am. A 10(10) 2193-2201 (1993)

Macroscopic self-consistent model for external-reflection near-field microscopy

S. Berntsen, E. Bozhevolnaya, and S. Bozhevolnyi
J. Opt. Soc. Am. A 10(5) 878-885 (1993)

Sample–tip coupling efficiencies of the photon-scanning tunneling microscope

L. Salomon, F. De Fornel, and J. P. Goudonnet
J. Opt. Soc. Am. A 8(12) 2009-2015 (1991)