Abstract

The 4 × 4 matrix formalisms developed respectively by Berreman [ D. W. Berreman, J. Opt. Soc. Am. 62, 502 ( 1972)] and by Yeh [P. Yeh, J. Opt. Soc. Am. 69, 742 ( 1979)] for the description of the ellipsometric properties of planar multilayer anisotropic media are compared. Features of both are used to provide a framework that is applicable to the calculation of ellipsometric properties of, e.g., stratified media that incorporate magnetic materials.

© 1984 Optical Society of America

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