Abstract

Measurements of a reduced Mueller matrix in backscattering from highly diffusive, dielectric samples are reported as a function of the angle of incidence. It was found that the off-diagonal terms depend greatly on the angle of incidence, increasing to a maximum near grazing incidence. We show that, despite a significant scattering originating in the bulk of such diffusive media, the nontrivial behavior of the off-diagonal Muller matrix is primarily due to surface scattering phenomena. The experimental data can be simply explained by assuming a random orientation of small particles and considering only double scattering in the plane of the surface.

© 2002 Optical Society of America

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