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Superresolving masks for incoherent high-numerical-aperture scanning microscopy in three dimensions

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Abstract

A singular-value-decomposition analysis of the imaging kernel for three-dimensional fluorescent laser scanning microscopy at a high numerical aperture (NA) is presented. The design and superresolving performance of image-plane binary optical masks are then derived, and new computational techniques for calculating these masks are given. Initial experimental results with a microscope equipped with such a mask at NA=1.3 are presented. The improvement in both contrast and resolution over the confocal and type 1 instruments is demonstrated.

© 1998 Optical Society of America

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