A heuristic formalism is developed for efficiently determining the specular reflectivity spectrum of two-dimensionally textured planar waveguides. The formalism is based on a Green’s function approach wherein the electric fields are assumed to vary little over the thickness of the textured part of the waveguide. Its accuracy, when the thickness of the textured region is much smaller than the wavelength of relevant radiation, is verified by comparison with a much less efficient, exact finite difference solution of Maxwell’s equations. In addition to its numerical efficiency, the formalism provides an intuitive explanation of Fano-like features evident in the specular reflectivity spectrum when the incident radiation is phase matched to excite leaky electromagnetic modes attached to the waveguide. By associating various Fourier components of the scattered field with bare slab modes, the dispersion, unique polarization properties, and lifetimes of these Fano-like features are explained in terms of photonic eigenmodes that reveal the renormalization of the slab modes due to interaction with the two-dimensional grating. An application of the formalism, in the analysis of polarization-insensitive notch filters, is also discussed.
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