Method of source terms for dipole emission modification in modes of arbitrary planar structures

Abstract

Modification of dipole emission that is due to its optical environment is calculated for planar layered structures. The layers are optically described by standard matrix techniques, and the dipole is included by using additive source terms for the electric field that depend on dipole orientation and wave polarization. These source terms also allow coupling through evanescent waves. We emphasize the applicability of this method to cases in which the power distribution into various modes is affected: dipole emission into guided modes and emission distribution into the various modes of structures that contain multilayer reflectors, such as microcavities.

© 1998 Optical Society of America

Simulation of light emission from thin-film microcavities

Kristiaan A. Neyts
J. Opt. Soc. Am. A 15(4) 962-971 (1998)

Dipole radiation into grating structures

Hervé Rigneault, Fabien Lemarchand, and Anne Sentenac
J. Opt. Soc. Am. A 17(6) 1048-1058 (2000)

Rigorous electromagnetic analysis of dipole emission in periodically corrugated layers: the grating-assisted resonant-cavity light-emitting diode

Danaë Delbeke, Peter Bienstman, Ronny Bockstaele, and Roel Baets
J. Opt. Soc. Am. A 19(5) 871-880 (2002)

Calculation of light scattering from particles and structures on a surface by the coupled-dipole method

Marc A. Taubenblatt and Tuyen K. Tran
J. Opt. Soc. Am. A 10(5) 912-919 (1993)

Electromagnetic power provided by sources within multilayer optics: free-space and modal patterns

Claude Amra and Sophie Maure
J. Opt. Soc. Am. A 14(11) 3102-3113 (1997)