Abstract

The dispersion of the refractive index of Bi<sub>12</sub>GeO<sub>20</sub> in the range 1.2–5.0 µm at room temperature has been obtained. Data have been analyzed in terms of Ketteler, Sellmeier–Drude, Lorentz–Lorenz, and Herzberger dispersion formulas. It is found that a Herzberger formula completely describes data on <i>n</i>(λ) up to the visible region.

© 1983 Optical Society of America

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  1. S. C. Abrahams, P. B. Jamieson, and J. L. Bernstein, "Crystal structure of piezoelectric bismuth germanium oxide Bi12GeO20," J. Chem. Phys. 47, 4034–4041 (1967).
  2. M. Peltier and F. Micheron, "Volume hologram recording and charge transfer process in Bi12GeO20 and Bi12GeO20," J. Appl. Phys. 48, 3683–3690 (1977).
  3. S. G. Lipson and P. Nisenson, "Imaging characteristics of the Itek PROM," Appl. Opt. 13, 2052–2060 (1974).
  4. D. W. Parker, R. G. Pratt, and R. Stevens, "A television IF acoustic surface wave filter on bismuth silicon oxide," Proc. IEEE 64, 677–681 (1976).
  5. R. E. Aldrich, S. L. Hou, and M. L. Harvill, "Electrical and optical properties of Bi12GeO20," J. Appl. Phys. 42, 493–494 (1971).
  6. G. Cappuccio, A. D'Amico, S. D'Angelo, and C. Ranghiasci, "Photometric linearity test for infrared spectrophotometers by means of a rotating sector disk attenuator," Appl. Opt. 21, 3619–3622 (1982).
  7. G. Cappuccio and S. D'Angelo, "Accessory for specular reflectance measurements with double beam spectrophotometers," J. Phys. E 11, 298–299 (1978).
  8. D. D. Sell, H. C. Casey, Jr., and K. W. Wecht, "Concentration dependence of the refractive index for n- and p-type GaAs between 1.2 and 1.8 eV," J. Appl. Phys. 45, 2650–2657 (1974).
  9. F. Oswald and R. Schade, "On the determination of the optical constants of semiconductors of type AIIIBv in the infrared," Z. Naturforsch. 9a, 611–617 (1954).
  10. B. Paul, "Nomogram for calculation of optical constants from transmittance and reflectance measurements," Infrared Phys. 5, 161–173 (1965).
  11. K. Vedam and P. Hennessey, "Piezo- and thermo-optical properties of Bi12GeO20, II. Refractive index," J. Opt. Soc. Am. 65, 442–445 (1975).
  12. P. Hennessey and K. Vedam, "Piezo- and thermo-optical properties of Bi12GeO20-III. The dispersion theories and models," J. Opt. Soc. Am. 69, 352–356 (1979).
  13. M. Herzberger, "Colour correction in optical systems and a new dispersion formula," Opt. Acta 6, 197–215 (1959).

1982 (1)

1979 (1)

1978 (1)

G. Cappuccio and S. D'Angelo, "Accessory for specular reflectance measurements with double beam spectrophotometers," J. Phys. E 11, 298–299 (1978).

1977 (1)

M. Peltier and F. Micheron, "Volume hologram recording and charge transfer process in Bi12GeO20 and Bi12GeO20," J. Appl. Phys. 48, 3683–3690 (1977).

1975 (1)

1974 (2)

S. G. Lipson and P. Nisenson, "Imaging characteristics of the Itek PROM," Appl. Opt. 13, 2052–2060 (1974).

D. D. Sell, H. C. Casey, Jr., and K. W. Wecht, "Concentration dependence of the refractive index for n- and p-type GaAs between 1.2 and 1.8 eV," J. Appl. Phys. 45, 2650–2657 (1974).

1971 (1)

R. E. Aldrich, S. L. Hou, and M. L. Harvill, "Electrical and optical properties of Bi12GeO20," J. Appl. Phys. 42, 493–494 (1971).

1967 (1)

S. C. Abrahams, P. B. Jamieson, and J. L. Bernstein, "Crystal structure of piezoelectric bismuth germanium oxide Bi12GeO20," J. Chem. Phys. 47, 4034–4041 (1967).

1965 (1)

B. Paul, "Nomogram for calculation of optical constants from transmittance and reflectance measurements," Infrared Phys. 5, 161–173 (1965).

1959 (1)

M. Herzberger, "Colour correction in optical systems and a new dispersion formula," Opt. Acta 6, 197–215 (1959).

1954 (1)

F. Oswald and R. Schade, "On the determination of the optical constants of semiconductors of type AIIIBv in the infrared," Z. Naturforsch. 9a, 611–617 (1954).

Abrahams, S. C.

S. C. Abrahams, P. B. Jamieson, and J. L. Bernstein, "Crystal structure of piezoelectric bismuth germanium oxide Bi12GeO20," J. Chem. Phys. 47, 4034–4041 (1967).

Aldrich, R. E.

R. E. Aldrich, S. L. Hou, and M. L. Harvill, "Electrical and optical properties of Bi12GeO20," J. Appl. Phys. 42, 493–494 (1971).

Bernstein, J. L.

S. C. Abrahams, P. B. Jamieson, and J. L. Bernstein, "Crystal structure of piezoelectric bismuth germanium oxide Bi12GeO20," J. Chem. Phys. 47, 4034–4041 (1967).

Cappuccio, G.

G. Cappuccio, A. D'Amico, S. D'Angelo, and C. Ranghiasci, "Photometric linearity test for infrared spectrophotometers by means of a rotating sector disk attenuator," Appl. Opt. 21, 3619–3622 (1982).

G. Cappuccio and S. D'Angelo, "Accessory for specular reflectance measurements with double beam spectrophotometers," J. Phys. E 11, 298–299 (1978).

Casey, Jr., H. C.

D. D. Sell, H. C. Casey, Jr., and K. W. Wecht, "Concentration dependence of the refractive index for n- and p-type GaAs between 1.2 and 1.8 eV," J. Appl. Phys. 45, 2650–2657 (1974).

D'Amico, A.

D'Angelo, S.

G. Cappuccio, A. D'Amico, S. D'Angelo, and C. Ranghiasci, "Photometric linearity test for infrared spectrophotometers by means of a rotating sector disk attenuator," Appl. Opt. 21, 3619–3622 (1982).

G. Cappuccio and S. D'Angelo, "Accessory for specular reflectance measurements with double beam spectrophotometers," J. Phys. E 11, 298–299 (1978).

Harvill, M. L.

R. E. Aldrich, S. L. Hou, and M. L. Harvill, "Electrical and optical properties of Bi12GeO20," J. Appl. Phys. 42, 493–494 (1971).

Hennessey, P.

Herzberger, M.

M. Herzberger, "Colour correction in optical systems and a new dispersion formula," Opt. Acta 6, 197–215 (1959).

Hou, S. L.

R. E. Aldrich, S. L. Hou, and M. L. Harvill, "Electrical and optical properties of Bi12GeO20," J. Appl. Phys. 42, 493–494 (1971).

Jamieson, P. B.

S. C. Abrahams, P. B. Jamieson, and J. L. Bernstein, "Crystal structure of piezoelectric bismuth germanium oxide Bi12GeO20," J. Chem. Phys. 47, 4034–4041 (1967).

Lipson, S. G.

Micheron, F.

M. Peltier and F. Micheron, "Volume hologram recording and charge transfer process in Bi12GeO20 and Bi12GeO20," J. Appl. Phys. 48, 3683–3690 (1977).

Nisenson, P.

Oswald, F.

F. Oswald and R. Schade, "On the determination of the optical constants of semiconductors of type AIIIBv in the infrared," Z. Naturforsch. 9a, 611–617 (1954).

Parker, D. W.

D. W. Parker, R. G. Pratt, and R. Stevens, "A television IF acoustic surface wave filter on bismuth silicon oxide," Proc. IEEE 64, 677–681 (1976).

Paul, B.

B. Paul, "Nomogram for calculation of optical constants from transmittance and reflectance measurements," Infrared Phys. 5, 161–173 (1965).

Peltier, M.

M. Peltier and F. Micheron, "Volume hologram recording and charge transfer process in Bi12GeO20 and Bi12GeO20," J. Appl. Phys. 48, 3683–3690 (1977).

Pratt, R. G.

D. W. Parker, R. G. Pratt, and R. Stevens, "A television IF acoustic surface wave filter on bismuth silicon oxide," Proc. IEEE 64, 677–681 (1976).

Ranghiasci, C.

Schade, R.

F. Oswald and R. Schade, "On the determination of the optical constants of semiconductors of type AIIIBv in the infrared," Z. Naturforsch. 9a, 611–617 (1954).

Sell, D. D.

D. D. Sell, H. C. Casey, Jr., and K. W. Wecht, "Concentration dependence of the refractive index for n- and p-type GaAs between 1.2 and 1.8 eV," J. Appl. Phys. 45, 2650–2657 (1974).

Stevens, R.

D. W. Parker, R. G. Pratt, and R. Stevens, "A television IF acoustic surface wave filter on bismuth silicon oxide," Proc. IEEE 64, 677–681 (1976).

Vedam, K.

Wecht, K. W.

D. D. Sell, H. C. Casey, Jr., and K. W. Wecht, "Concentration dependence of the refractive index for n- and p-type GaAs between 1.2 and 1.8 eV," J. Appl. Phys. 45, 2650–2657 (1974).

Appl. Opt. (2)

Infrared Phys. (1)

B. Paul, "Nomogram for calculation of optical constants from transmittance and reflectance measurements," Infrared Phys. 5, 161–173 (1965).

J. Appl. Phys. (3)

R. E. Aldrich, S. L. Hou, and M. L. Harvill, "Electrical and optical properties of Bi12GeO20," J. Appl. Phys. 42, 493–494 (1971).

D. D. Sell, H. C. Casey, Jr., and K. W. Wecht, "Concentration dependence of the refractive index for n- and p-type GaAs between 1.2 and 1.8 eV," J. Appl. Phys. 45, 2650–2657 (1974).

M. Peltier and F. Micheron, "Volume hologram recording and charge transfer process in Bi12GeO20 and Bi12GeO20," J. Appl. Phys. 48, 3683–3690 (1977).

J. Chem. Phys. (1)

S. C. Abrahams, P. B. Jamieson, and J. L. Bernstein, "Crystal structure of piezoelectric bismuth germanium oxide Bi12GeO20," J. Chem. Phys. 47, 4034–4041 (1967).

J. Opt. Soc. Am. (2)

J. Phys. (1)

G. Cappuccio and S. D'Angelo, "Accessory for specular reflectance measurements with double beam spectrophotometers," J. Phys. E 11, 298–299 (1978).

Opt. Acta (1)

M. Herzberger, "Colour correction in optical systems and a new dispersion formula," Opt. Acta 6, 197–215 (1959).

Z. Naturforsch. (1)

F. Oswald and R. Schade, "On the determination of the optical constants of semiconductors of type AIIIBv in the infrared," Z. Naturforsch. 9a, 611–617 (1954).

Other (1)

D. W. Parker, R. G. Pratt, and R. Stevens, "A television IF acoustic surface wave filter on bismuth silicon oxide," Proc. IEEE 64, 677–681 (1976).

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