Abstract

A simple extension of techniques used in designing conventional single-peak narrow-band filters permits the design of filters having two or mote peaks. The design procedure and monitoring techniques are discussed. An example of an actual filter produced by using this technique is presented.

© 1982 Optical Society of America

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References

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  1. A. Thelen, "Equivalent layers in multilayer filters," J. Opt. Soc. Am. 50, 1533–1538 (1966).
  2. C. Jacobs, "Dielectric square bandpass design," Appl. Opt. 20, 1039–1042 (1981).
  3. H. A. Macleod, "Turning value monitoring of narrow-band all-dielectric thin-film optical filters," Opt. Acta 19, 1–28 (1972).
  4. P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, and P. Roche, "Optical filters: monitoring process allowing the auto-correlation of thickness errors," Thin Solid Films 13, 285–290 (1972).
  5. H. A. MacLeod and D. Richmond, "The effect of errors in the optical monitoring of narrow-band all-dielectric thin film optical filters," Opt. Acta 21, 429-443 (1974).

1981 (1)

1974 (1)

H. A. MacLeod and D. Richmond, "The effect of errors in the optical monitoring of narrow-band all-dielectric thin film optical filters," Opt. Acta 21, 429-443 (1974).

1972 (2)

H. A. Macleod, "Turning value monitoring of narrow-band all-dielectric thin-film optical filters," Opt. Acta 19, 1–28 (1972).

P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, and P. Roche, "Optical filters: monitoring process allowing the auto-correlation of thickness errors," Thin Solid Films 13, 285–290 (1972).

1966 (1)

A. Thelen, "Equivalent layers in multilayer filters," J. Opt. Soc. Am. 50, 1533–1538 (1966).

Bousquet, P.

P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, and P. Roche, "Optical filters: monitoring process allowing the auto-correlation of thickness errors," Thin Solid Films 13, 285–290 (1972).

Fornier, A.

P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, and P. Roche, "Optical filters: monitoring process allowing the auto-correlation of thickness errors," Thin Solid Films 13, 285–290 (1972).

Jacobs, C.

Kowalczyk, R.

P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, and P. Roche, "Optical filters: monitoring process allowing the auto-correlation of thickness errors," Thin Solid Films 13, 285–290 (1972).

MacLeod, H. A.

H. A. MacLeod and D. Richmond, "The effect of errors in the optical monitoring of narrow-band all-dielectric thin film optical filters," Opt. Acta 21, 429-443 (1974).

H. A. Macleod, "Turning value monitoring of narrow-band all-dielectric thin-film optical filters," Opt. Acta 19, 1–28 (1972).

Pelletier, E.

P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, and P. Roche, "Optical filters: monitoring process allowing the auto-correlation of thickness errors," Thin Solid Films 13, 285–290 (1972).

Richmond, D.

H. A. MacLeod and D. Richmond, "The effect of errors in the optical monitoring of narrow-band all-dielectric thin film optical filters," Opt. Acta 21, 429-443 (1974).

Roche, P.

P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, and P. Roche, "Optical filters: monitoring process allowing the auto-correlation of thickness errors," Thin Solid Films 13, 285–290 (1972).

Thelen, A.

A. Thelen, "Equivalent layers in multilayer filters," J. Opt. Soc. Am. 50, 1533–1538 (1966).

Appl. Opt. (1)

J. Opt. Soc. Am. (1)

A. Thelen, "Equivalent layers in multilayer filters," J. Opt. Soc. Am. 50, 1533–1538 (1966).

Opt. Acta (2)

H. A. MacLeod and D. Richmond, "The effect of errors in the optical monitoring of narrow-band all-dielectric thin film optical filters," Opt. Acta 21, 429-443 (1974).

H. A. Macleod, "Turning value monitoring of narrow-band all-dielectric thin-film optical filters," Opt. Acta 19, 1–28 (1972).

Thin Solid Films (1)

P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, and P. Roche, "Optical filters: monitoring process allowing the auto-correlation of thickness errors," Thin Solid Films 13, 285–290 (1972).

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