Abstract

A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

© 1981 Optical Society of America

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  1. D. M. Meadows, W. O. Johnson, and J. B. Allen, "Generation of surface contours by moiré patterns," Appl. Opt. 9, 942–947 (1970); H. Takasaki, "Moiré topography," Appl. Opt. 9,1467–1472 (1970). Although these papers describe methods that use a shadow of a grating, our proposed method applies to a projected grating image as in projection-type moiré topography; for a discussion of projection-type moiré topography, see, for example, M. Idesawa, T. Yatagai, and T. Soma, "Scanning moiré method and automatic measurement of 3-D shape," Appl. Opt. 16, 2152–2162 (1977).
  2. J. H. Bruning, "Fringe scanning interferometers," in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1978), pp. 409–437.
  3. In all figures, the variation in the y direction is not illustrated because it is not necessary for the explanation of the principle.
  4. The superscript x denotes that Øox(x, y) is an offset phase for correcting discontinuities in the x direction along a line for which y is fixed; the same is denoted by the superscript y for the y direction. The offset phase without a superscript means that discontinuities can be corrected by it in both x and y directions.
  5. In all figures, note only the scales indicated by large letters and ignore the fine letters and scales on the axes drawn by the graphic plotter subroutine.

1978 (1)

J. H. Bruning, "Fringe scanning interferometers," in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1978), pp. 409–437.

1970 (1)

Allen, J. B.

Bruning, J. H.

J. H. Bruning, "Fringe scanning interferometers," in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1978), pp. 409–437.

Johnson, W. O.

Meadows, D. M.

Appl. Opt. (1)

Other (4)

J. H. Bruning, "Fringe scanning interferometers," in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1978), pp. 409–437.

In all figures, the variation in the y direction is not illustrated because it is not necessary for the explanation of the principle.

The superscript x denotes that Øox(x, y) is an offset phase for correcting discontinuities in the x direction along a line for which y is fixed; the same is denoted by the superscript y for the y direction. The offset phase without a superscript means that discontinuities can be corrected by it in both x and y directions.

In all figures, note only the scales indicated by large letters and ignore the fine letters and scales on the axes drawn by the graphic plotter subroutine.

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