Abstract

The analysis of structural information of planar holograms (i.e., “surface” holograms in integrated optics) is presented by using Ewald’s construction and a grating vector uncertainty theorem. The influences of the geometry and the material constants of the holographic system, the modulation transfer function, and dimensions of the hologram are given. A new approach to the transfer of information, connected with multimode operation, is presented.

© 1981 Optical Society of America

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