Abstract

Partial wave analysis is used to obtain analytical expressions for the diffraction efficiencies of evanescent-wave holograms. Among other results it is shown that the maximum diffraction efficiency occurs when the angle of the reconstruction beam or the angle of the diffracted beam is equal to the critical angle. In paper I the dependence of the diffraction efficiency on spatial frequencies in the hologram and on the angle of the reconstruction beam is presented for a reconstruction beam with TE polarization. The analysis and results for TM polarization are presented in paper II.

© 1978 Optical Society of America

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Equations (34)

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