Abstract

Partial wave analysis is used to obtain analytical expressions for the diffraction efficiencies of evanescent-wave holograms. Among other results it is shown that the maximum diffraction efficiency occurs when the angle of the reconstruction beam or the angle of the diffracted beam is equal to the critical angle. In paper I the dependence of the diffraction efficiency on spatial frequencies in the hologram and on the angle of the reconstruction beam is presented for a reconstruction beam with TE polarization. The analysis and results for TM polarization are presented in paper II.

© 1978 Optical Society of America

Diffraction efficiency of evanescent-wave holograms. II. TM polarization

Wai-Hon Lee and William Streifer
J. Opt. Soc. Am. 68(6) 802-806 (1978)

Geometry of recording and color sensitivity for evanescent wave holography using a Gaussian beam

Jerzy Woznicki
Appl. Opt. 19(4) 631-637 (1980)

Holography with Evanescent Waves

Olof Bryngdahl
J. Opt. Soc. Am. 59(12) 1645-1650 (1969)

Efficiency and Image Contrast of Dielectric Holograms*

Juris Upatnieks and Carl Leonard
J. Opt. Soc. Am. 60(3) 297-305 (1970)

Measurement of diffraction efficiency, SNR, and resolution of single- and multiple-exposure amplitude and bleached holograms

M. J. Landry, G. S. Phipps, and C. E. Robertson
Appl. Opt. 17(11) 1764-1770 (1978)