Abstract

Reflectivity spectra of lead telluride epitaxial layers on BaF₂ and NaCl substrates have been investigated in the wave-number range of 5–100 cm⁻¹. Due to multiple reflections and interference effects in the sandwich samples, weak structures in the reflectivity spectra are accentuated. This leads to a more precise determination of the lattice parameters, especially the TO-phonon mode frequency as compared to measurements using bulk samples. By measuring the back-surface (NaCl or BaF₂) reflectivity, an additional advantage caused by a kind of index matching is achieved. The temperature dependence (T = 4.2–300 K) and the carrier concentration dependence of the PbTe TO-phonon mode frequency was determined.

© 1977 Optical Society of America

Far-infrared studies in epitaxial films of III–V and IV–VI semiconductors*

P. M. Amirtharaj, B. L. Bean, and S. Perkowitz
J. Opt. Soc. Am. 67(7) 939-942 (1977)

The transverse optical mode anharmonic self-energy of NaCl from measurements by dispersive Fourier-transform spectroscopy

K. F. Pai, A. Rastogi, N. E. Tornberg, T. J. Parker, and R. P. Lowndes
J. Opt. Soc. Am. 67(7) 914-917 (1977)

Submillimeter wave spectroscopy of the atmosphere

J. E. Harries
J. Opt. Soc. Am. 67(7) 880-893 (1977)

Analysis of infrared reflectivity in the presence of asymmetrical phonon lines

J. L. Servoin and F. Gervais
Appl. Opt. 16(11) 2952-2956 (1977)

Submillimeter–far-infrared spectroscopy in the liquid and solid states with a tunable optically pumped laser*

B. L. Bean and S. Perkowitz
J. Opt. Soc. Am. 67(7) 911-914 (1977)