Abstract

No abstract available.

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. C. H. Hall, Introduction to Electron Microscopy (McGraw-Hill, New York, 1963).
  2. D. Gabor, Nature 161, 777 (1948).
    [Crossref]
  3. M. E. Haine and T. Mulvey, J. Opt. Soc. Am. 42, 163 (1952).
    [Crossref]
  4. T. Hibi, J. Electron Microsc. 4, 10 (1956).
  5. A. TonomuraA Fukuhara, H. Watanabe, and T. Komoda, Jpn. J. Appl. Phys. 7, 296 (1968).
    [Crossref]
  6. H. Tomita, T. Matsuda, and T. Komoda, Jpn. J. Appl. Phys. 11, 143 (1972).
    [Crossref]
  7. G. W. Stroke and G. Zech, Phys. Lett. A 25, 89 (1967).
    [Crossref]
  8. G. W. Stroke and M. Halioua, Phys. Lett. A 33, 3 (1970).
    [Crossref]
  9. G. W. Stroke and M. Halioua, Optik (Stuttgart) 35, 50 (1972).
  10. L. J. Cutrona and E. N. Leith, Proc. IEEE 54, 1026 (1966).
    [Crossref]
  11. T. Hidaka, J. Appl. Phys. 46, 786 (1975).
    [Crossref]

1975 (1)

T. Hidaka, J. Appl. Phys. 46, 786 (1975).
[Crossref]

1972 (2)

H. Tomita, T. Matsuda, and T. Komoda, Jpn. J. Appl. Phys. 11, 143 (1972).
[Crossref]

G. W. Stroke and M. Halioua, Optik (Stuttgart) 35, 50 (1972).

1970 (1)

G. W. Stroke and M. Halioua, Phys. Lett. A 33, 3 (1970).
[Crossref]

1968 (1)

A. TonomuraA Fukuhara, H. Watanabe, and T. Komoda, Jpn. J. Appl. Phys. 7, 296 (1968).
[Crossref]

1967 (1)

G. W. Stroke and G. Zech, Phys. Lett. A 25, 89 (1967).
[Crossref]

1966 (1)

L. J. Cutrona and E. N. Leith, Proc. IEEE 54, 1026 (1966).
[Crossref]

1956 (1)

T. Hibi, J. Electron Microsc. 4, 10 (1956).

1952 (1)

M. E. Haine and T. Mulvey, J. Opt. Soc. Am. 42, 163 (1952).
[Crossref]

1948 (1)

D. Gabor, Nature 161, 777 (1948).
[Crossref]

Cutrona, L. J.

L. J. Cutrona and E. N. Leith, Proc. IEEE 54, 1026 (1966).
[Crossref]

Gabor, D.

D. Gabor, Nature 161, 777 (1948).
[Crossref]

Haine, M. E.

M. E. Haine and T. Mulvey, J. Opt. Soc. Am. 42, 163 (1952).
[Crossref]

Halioua, M.

G. W. Stroke and M. Halioua, Optik (Stuttgart) 35, 50 (1972).

G. W. Stroke and M. Halioua, Phys. Lett. A 33, 3 (1970).
[Crossref]

Hall, C. H.

C. H. Hall, Introduction to Electron Microscopy (McGraw-Hill, New York, 1963).

Hibi, T.

T. Hibi, J. Electron Microsc. 4, 10 (1956).

Hidaka, T.

T. Hidaka, J. Appl. Phys. 46, 786 (1975).
[Crossref]

Komoda, T.

H. Tomita, T. Matsuda, and T. Komoda, Jpn. J. Appl. Phys. 11, 143 (1972).
[Crossref]

A. TonomuraA Fukuhara, H. Watanabe, and T. Komoda, Jpn. J. Appl. Phys. 7, 296 (1968).
[Crossref]

Leith, E. N.

L. J. Cutrona and E. N. Leith, Proc. IEEE 54, 1026 (1966).
[Crossref]

Matsuda, T.

H. Tomita, T. Matsuda, and T. Komoda, Jpn. J. Appl. Phys. 11, 143 (1972).
[Crossref]

Mulvey, T.

M. E. Haine and T. Mulvey, J. Opt. Soc. Am. 42, 163 (1952).
[Crossref]

Stroke, G. W.

G. W. Stroke and M. Halioua, Optik (Stuttgart) 35, 50 (1972).

G. W. Stroke and M. Halioua, Phys. Lett. A 33, 3 (1970).
[Crossref]

G. W. Stroke and G. Zech, Phys. Lett. A 25, 89 (1967).
[Crossref]

Tomita, H.

H. Tomita, T. Matsuda, and T. Komoda, Jpn. J. Appl. Phys. 11, 143 (1972).
[Crossref]

TonomuraA Fukuhara, A.

A. TonomuraA Fukuhara, H. Watanabe, and T. Komoda, Jpn. J. Appl. Phys. 7, 296 (1968).
[Crossref]

Watanabe, H.

A. TonomuraA Fukuhara, H. Watanabe, and T. Komoda, Jpn. J. Appl. Phys. 7, 296 (1968).
[Crossref]

Zech, G.

G. W. Stroke and G. Zech, Phys. Lett. A 25, 89 (1967).
[Crossref]

J. Appl. Phys. (1)

T. Hidaka, J. Appl. Phys. 46, 786 (1975).
[Crossref]

J. Electron Microsc. (1)

T. Hibi, J. Electron Microsc. 4, 10 (1956).

J. Opt. Soc. Am. (1)

M. E. Haine and T. Mulvey, J. Opt. Soc. Am. 42, 163 (1952).
[Crossref]

Jpn. J. Appl. Phys. (2)

A. TonomuraA Fukuhara, H. Watanabe, and T. Komoda, Jpn. J. Appl. Phys. 7, 296 (1968).
[Crossref]

H. Tomita, T. Matsuda, and T. Komoda, Jpn. J. Appl. Phys. 11, 143 (1972).
[Crossref]

Nature (1)

D. Gabor, Nature 161, 777 (1948).
[Crossref]

Optik (Stuttgart) (1)

G. W. Stroke and M. Halioua, Optik (Stuttgart) 35, 50 (1972).

Phys. Lett. A (2)

G. W. Stroke and G. Zech, Phys. Lett. A 25, 89 (1967).
[Crossref]

G. W. Stroke and M. Halioua, Phys. Lett. A 33, 3 (1970).
[Crossref]

Proc. IEEE (1)

L. J. Cutrona and E. N. Leith, Proc. IEEE 54, 1026 (1966).
[Crossref]

Other (1)

C. H. Hall, Introduction to Electron Microscopy (McGraw-Hill, New York, 1963).

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

FIG. 1
FIG. 1

Electron–optical system for synthetic-aperture electron microscopy. (x1, u1) is the position of a point object. f0 is the focal length of the lens on axis. 2a is the aperture diameter for the reference wave (about 1 μm). b1 and b2 are the lower and upper limits of lens aperture. (x2, u2) is the image point of the object lh and xh are the coordinates on the hologram plane.

FIG. 2
FIG. 2

Electron-ray trajectory versus focal length f0, which is changeable by magnetic current, α =0.1 mm−2, u1 = 5 mm, and lh = 50 mm.

FIG. 3
FIG. 3

Hologram pattern at lh = 50 mm. Electron wavelength is 0.1 Å. x1 = 5 Å.

FIG. 4
FIG. 4

Reconstructed image of the object at x1 =5 Å in Fig. 1. Conditions are the same as Figs. 2 and 3.

Equations (5)

Equations on this page are rendered with MathJax. Learn more.

f = f 0 ( 1 - α b 2 ) ,
1 u 1 + 1 u 2 = 1 f 0 ( 1 - α b 2 ) .
[ 1 - l h ( 1 u 1 - 1 f 0 ( 1 - α b 2 ) ) ] b + l h u 1 x 1 - x h = 0.
I ( x i , y i ; ω ) = S ( x i , y i ; ω ; x 0 , y 0 ) * O ( x 0 , y 0 ) ,
O ( x 0 , y 0 ) = S - 1 ( x 0 , y 0 , x i , y i , ω ) * I ( x i , y i , ω ) ,