J. M. Bennett and H. E. Bennett, in Handbook of Optics, edited by W. G. Driscoll and W. Vaughan (McGraw—Hill, New York, 1975).
The magnitude of the attenuation is independent of the incident polarization.
R. M. A. Azzam, A. -R. M. Zaghloul, and N. M. Bashara, J. Opt. Soc. Am. 65, 252 (1975).
Note that, whereas the use of a film—substrate system as a reflection retarder is new, its use as a reflection polarizer is well known. See, for example, M. Ruiz-Urbieta and E. M. Sparrow, J. Opt. Soc. Am. 62, 1188 (1972) and other papers in this series.
Ellipsometric Tables of the Si—SiO2 System for Mercury and He—Ne Laser Spectral Lines, edited by G. Gergely (Akademiai Kiado, Budapest, 1971).
In step 1, instead of using ρ = eƒΔ, we use the general form ρ = tanψejΔ; steps 2–5 remain unchanged.
The derivation of Eqs. (2) and (3) is given in Ref. 3.
Alternatively, the angle of incidence φ′ can be obtained by anynumerical method (e.g., successive bisection) to find the rootof the equation | X | = 1.
Our investigation of the effect of substrate absorption on the results of the film-substrate single-reflection retarder designs has shown that the mirror symmetry of the two branches B+ and B- occurs exactly only when the substrate is totally transparent. Deviation from exact symmetry increases with substrate absorption.
Angle-of-incidence-tunable retarders are those with the least thickness. By adding multiples of Dφ, the performance of the retarder gets worse, refer to Fig. 11(left).
An alternative procedure would be to add the appropriate multiple of Dφ, at each φ, to the image of the unit circle and to obtain the intersection points of this vertically translated image with the straight line d = const. In general, the first method is more convenient.
The existence of exact reflection-retardation modes depends, for a particular system at a given wavelength, on the film thickness only.
dmin and dmax are obtained by extrapolation to Δ= 0° and ° = ∓180° of the branches shown in Fig. 4.