Abstract

Speckle photography offers a technique for measuring small strains on an object in the presence of large displacements. An analysis is presented of this technique, which accounts for the phenomena observed and predicts its capabilities and limitations. The analysis is sufficiently general to describe either of two related techniques, one that permits measurement of strains in the absence of large displacements and one that permits measurement of large displacements alone.

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  1. E. Archbold, J. M. Burch, and A. E. Ennos, Opt. Acta 17, 883 (1970).
  2. J. A. Leendertz, J. Phys. 3, 214 (1970).
  3. J. M. Burch and J. M. J. Tokarski, Opt. Acta 15, 101 (1968).
  4. K. Biedermann, Optik 28, 160 (1968).
  5. H. J. Tiziani, Opt. Acta 18, 891 (1971).
  6. H. J. Tiziani, Opt. Commun. 5, 217 (1972).
  7. H. J. Tiziani, Optik 34, 442 (1972).
  8. H. J. Tiziani, Appl. Opt. 11, 2911 (1972).
  9. U. Köpf, Optik 33, 517 (1971).
  10. E. Archbold and A. E. Ennos, Opt. Acta 19, 253 (1972).
  11. K. A. Stetson, J. Opt. Soc. Am. 60, 1378 (1970).

Archbold, E.

E. Archbold, J. M. Burch, and A. E. Ennos, Opt. Acta 17, 883 (1970).

E. Archbold and A. E. Ennos, Opt. Acta 19, 253 (1972).

Biedermann, K.

K. Biedermann, Optik 28, 160 (1968).

Burch, J. M.

E. Archbold, J. M. Burch, and A. E. Ennos, Opt. Acta 17, 883 (1970).

J. M. Burch and J. M. J. Tokarski, Opt. Acta 15, 101 (1968).

Ennos, A. E.

E. Archbold and A. E. Ennos, Opt. Acta 19, 253 (1972).

E. Archbold, J. M. Burch, and A. E. Ennos, Opt. Acta 17, 883 (1970).

Köpf, U.

U. Köpf, Optik 33, 517 (1971).

Leendertz, J. A.

J. A. Leendertz, J. Phys. 3, 214 (1970).

Stetson, K. A.

K. A. Stetson, J. Opt. Soc. Am. 60, 1378 (1970).

Tiziani, H. J.

H. J. Tiziani, Opt. Acta 18, 891 (1971).

H. J. Tiziani, Opt. Commun. 5, 217 (1972).

H. J. Tiziani, Optik 34, 442 (1972).

H. J. Tiziani, Appl. Opt. 11, 2911 (1972).

Tokarski, J. M. J.

J. M. Burch and J. M. J. Tokarski, Opt. Acta 15, 101 (1968).

Other

E. Archbold, J. M. Burch, and A. E. Ennos, Opt. Acta 17, 883 (1970).

J. A. Leendertz, J. Phys. 3, 214 (1970).

J. M. Burch and J. M. J. Tokarski, Opt. Acta 15, 101 (1968).

K. Biedermann, Optik 28, 160 (1968).

H. J. Tiziani, Opt. Acta 18, 891 (1971).

H. J. Tiziani, Opt. Commun. 5, 217 (1972).

H. J. Tiziani, Optik 34, 442 (1972).

H. J. Tiziani, Appl. Opt. 11, 2911 (1972).

U. Köpf, Optik 33, 517 (1971).

E. Archbold and A. E. Ennos, Opt. Acta 19, 253 (1972).

K. A. Stetson, J. Opt. Soc. Am. 60, 1378 (1970).

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