Abstract

The reflectance for a bowl-feed polished Cer-Vit sample was measured at nine wavelengths and five angles of incidence from 15° to 85°. Optical constants were derived by the reflectance-vs-angle-of-incidence method and compared to previously reported values for ultra-low-expansion fused silica (ULE) and several other glasses. Surface-roughness corrections of the reflectance data and optical constants are discussed.

© 1974 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. Owens–Illinois Glass Company, Toledo, Ohio 43604.
  2. H. Wolter, Ann. Phys. 10, 1944 (1952); Ann. Phys. 10, 286 (1952).
  3. John D. Mangus, at Ninth Congress of the International Commission for Optics, October1972.
  4. Corning Glass Works, Corning, N. Y. 14830.
  5. H. R. Philipp, Solid State Commun. 4, 73 (1966).
    [Crossref]
  6. Eugene Loh, Solid State Commun. 2, 269 (1964).
    [Crossref]
  7. K. Platzoder and W. Steinmann, J. Opt. Soc. Am. 58, 588 (1968).
    [Crossref]
  8. H. R. Philipp and E. A. Taft, Phys. Rev. 136, A1445 (1964).
    [Crossref]
  9. T. Sasaki, H. Fukutani, and K. Ishiguro, Jap. J. Appl. Phys. 4, 527 (1965).
  10. L. R. Canfield, R. G. Johnston, and R. P. Madden, Appl. Opt. 12, 1611 (1973).
    [Crossref] [PubMed]
  11. J. A. R. Samson, Techniques of Vacuum Ultraviolet Spectroscopy (Wiley, New York, 1967).
  12. W. R. Hunter, Appl. Opt. 6, 2140 (1967).
    [Crossref] [PubMed]
  13. J. F. Osantowski and A. R. Toft, Appl. Opt. 11, 2976 (1972).
    [Crossref] [PubMed]
  14. Ralph W. Dietz and Jean M. Bennett, Appl. Opt. 5, 881 (1966).
    [PubMed]
  15. Jean M. Bennett, J. Opt. Soc. Am. 54, 612 (1964).
    [Crossref]
  16. Richard Tousey, J. Opt. Soc. Am. 29, 235 (1939).
    [Crossref]
  17. S. P. F. Humphreys-Owen, Proc. Phys. Soc. (Lond.) 77, 949 (1961).
    [Crossref]
  18. W. R. Hunter, J. Opt. Soc. Am. 55, 1197 (1965).
    [Crossref]
  19. D. Beaglehole, Proc. Phys. Soc. (Lond.) 86, 1007 (1965).
    [Crossref]
  20. H. E. Bennett and J. O. Porteus, J. Opt. Soc. Am. 51, 123 (1961).
    [Crossref]
  21. H. E. Bennett, J. Opt. Soc. Am. 53, 1389 (1963).
    [Crossref]
  22. John F. Osantowski, J. Opt. Soc. Am. 62, 1405A (1972).
  23. R. Fletcher and C. M. Reeves, Computer J. 7, 149 (1964).
    [Crossref]
  24. IBM System/360 Scientific Subroutine Package (360 A-CM-03X), Version 111.
  25. United States Patent2920971, 12January1960.
  26. Peter C. Schultz, J. Opt. Soc. Am. 62, 1399A (1972).

1973 (1)

1972 (3)

J. F. Osantowski and A. R. Toft, Appl. Opt. 11, 2976 (1972).
[Crossref] [PubMed]

John F. Osantowski, J. Opt. Soc. Am. 62, 1405A (1972).

Peter C. Schultz, J. Opt. Soc. Am. 62, 1399A (1972).

1968 (1)

1967 (1)

1966 (2)

1965 (3)

W. R. Hunter, J. Opt. Soc. Am. 55, 1197 (1965).
[Crossref]

D. Beaglehole, Proc. Phys. Soc. (Lond.) 86, 1007 (1965).
[Crossref]

T. Sasaki, H. Fukutani, and K. Ishiguro, Jap. J. Appl. Phys. 4, 527 (1965).

1964 (4)

Eugene Loh, Solid State Commun. 2, 269 (1964).
[Crossref]

H. R. Philipp and E. A. Taft, Phys. Rev. 136, A1445 (1964).
[Crossref]

Jean M. Bennett, J. Opt. Soc. Am. 54, 612 (1964).
[Crossref]

R. Fletcher and C. M. Reeves, Computer J. 7, 149 (1964).
[Crossref]

1963 (1)

1961 (2)

S. P. F. Humphreys-Owen, Proc. Phys. Soc. (Lond.) 77, 949 (1961).
[Crossref]

H. E. Bennett and J. O. Porteus, J. Opt. Soc. Am. 51, 123 (1961).
[Crossref]

1952 (1)

H. Wolter, Ann. Phys. 10, 1944 (1952); Ann. Phys. 10, 286 (1952).

1939 (1)

Beaglehole, D.

D. Beaglehole, Proc. Phys. Soc. (Lond.) 86, 1007 (1965).
[Crossref]

Bennett, H. E.

Bennett, Jean M.

Canfield, L. R.

Dietz, Ralph W.

Fletcher, R.

R. Fletcher and C. M. Reeves, Computer J. 7, 149 (1964).
[Crossref]

Fukutani, H.

T. Sasaki, H. Fukutani, and K. Ishiguro, Jap. J. Appl. Phys. 4, 527 (1965).

Humphreys-Owen, S. P. F.

S. P. F. Humphreys-Owen, Proc. Phys. Soc. (Lond.) 77, 949 (1961).
[Crossref]

Hunter, W. R.

Ishiguro, K.

T. Sasaki, H. Fukutani, and K. Ishiguro, Jap. J. Appl. Phys. 4, 527 (1965).

Johnston, R. G.

Loh, Eugene

Eugene Loh, Solid State Commun. 2, 269 (1964).
[Crossref]

Madden, R. P.

Mangus, John D.

John D. Mangus, at Ninth Congress of the International Commission for Optics, October1972.

Osantowski, J. F.

Osantowski, John F.

John F. Osantowski, J. Opt. Soc. Am. 62, 1405A (1972).

Philipp, H. R.

H. R. Philipp, Solid State Commun. 4, 73 (1966).
[Crossref]

H. R. Philipp and E. A. Taft, Phys. Rev. 136, A1445 (1964).
[Crossref]

Platzoder, K.

Porteus, J. O.

Reeves, C. M.

R. Fletcher and C. M. Reeves, Computer J. 7, 149 (1964).
[Crossref]

Samson, J. A. R.

J. A. R. Samson, Techniques of Vacuum Ultraviolet Spectroscopy (Wiley, New York, 1967).

Sasaki, T.

T. Sasaki, H. Fukutani, and K. Ishiguro, Jap. J. Appl. Phys. 4, 527 (1965).

Schultz, Peter C.

Peter C. Schultz, J. Opt. Soc. Am. 62, 1399A (1972).

Steinmann, W.

Taft, E. A.

H. R. Philipp and E. A. Taft, Phys. Rev. 136, A1445 (1964).
[Crossref]

Toft, A. R.

Tousey, Richard

Wolter, H.

H. Wolter, Ann. Phys. 10, 1944 (1952); Ann. Phys. 10, 286 (1952).

Ann. Phys. (1)

H. Wolter, Ann. Phys. 10, 1944 (1952); Ann. Phys. 10, 286 (1952).

Appl. Opt. (4)

Computer J. (1)

R. Fletcher and C. M. Reeves, Computer J. 7, 149 (1964).
[Crossref]

J. Opt. Soc. Am. (8)

Jap. J. Appl. Phys. (1)

T. Sasaki, H. Fukutani, and K. Ishiguro, Jap. J. Appl. Phys. 4, 527 (1965).

Phys. Rev. (1)

H. R. Philipp and E. A. Taft, Phys. Rev. 136, A1445 (1964).
[Crossref]

Proc. Phys. Soc. (Lond.) (2)

S. P. F. Humphreys-Owen, Proc. Phys. Soc. (Lond.) 77, 949 (1961).
[Crossref]

D. Beaglehole, Proc. Phys. Soc. (Lond.) 86, 1007 (1965).
[Crossref]

Solid State Commun. (2)

H. R. Philipp, Solid State Commun. 4, 73 (1966).
[Crossref]

Eugene Loh, Solid State Commun. 2, 269 (1964).
[Crossref]

Other (6)

John D. Mangus, at Ninth Congress of the International Commission for Optics, October1972.

Corning Glass Works, Corning, N. Y. 14830.

Owens–Illinois Glass Company, Toledo, Ohio 43604.

J. A. R. Samson, Techniques of Vacuum Ultraviolet Spectroscopy (Wiley, New York, 1967).

IBM System/360 Scientific Subroutine Package (360 A-CM-03X), Version 111.

United States Patent2920971, 12January1960.

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (6)

Fig. 1
Fig. 1

Measured reflectance of Cer-Vit sample 2 with the plane of incidence perpendicular and parallel to the plane of dispersion.

Fig. 2
Fig. 2

R = 1 2 ( R + R ) for Cer-Vit sample 2.

Fig. 3
Fig. 3

Comparison of the normal-incidence reflectance of Cer-Vit 2 (——) with ULE (Ref. 22) (— · —) and fused quartz (Ref. 7) (···).

Fig. 4
Fig. 4

Real part of the complex index of refraction for Cer-Vit sample 2, compared with the values for ULE (○), and those determined by Sasaki et al. (Ref. 9) for fused quartz (×), KF2 (□), F8 (△), and SF3 (+).

Fig. 5
Fig. 5

Imaginary part of the complex index of refraction for Cer-Vit sample 2 compared with the values for ULE (○), and those determined by Sasaki et al. (Ref. 9) for fused quartz (×), KF2 (□), F8 (△), and SF3 (+).

Fig. 6
Fig. 6

Mmin as a function of surface roughness, σ, for p constrained to zero (– – ○ – –) and for p unconstrained (— ● —), with the corresponding values for p(— △ —).

Tables (1)

Tables Icon

Table I The reflectance and optical constants for Cer-Vit sample 2. The first row shows the measured reflectances; the second row shows the values calculated from the corresponding n0, k0, as determined by the reflectance-vs-angle-of-incidence method. The first error estimate was calculated by use of all of the isoreflector intersections; the second was calculated by omitting the worst case.

Equations (3)

Equations on this page are rendered with MathJax. Learn more.

R = R m ( 1 - α β ) ( 1 - α ) ,
R = R 0 [ exp { - ( 4 π σ λ ) 2 } + 32 π 4 ( σ λ ) 4 ( Δ θ m ) 2 ] ,
M ( n , k , p ) = i [ R ( n , k , p , θ i ) - R m ( θ i ) ] 2 ,