Abstract

No abstract available.

Full Article  |  PDF Article
Related Articles
Investigation of Film Thickness Uniformity on Substrates Located Close to the Source Axis

Jean M. Bennett and E. J. Ashley
Appl. Opt. 12(4) 758-763 (1973)

Thin-film 2.8-μm and 3.8-μm absorption in single-layer films

James A. Harrington, J. Earl Rudisill, and Morris Braunstein
Appl. Opt. 17(17) 2798-2801 (1978)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Tables (1)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription