Ellipsometry in the Measurement of Surfaces and Thin Films, edited by E. Passaglia, R. R. Stromberg, and J. Kruger, Natl. Bur. Stand. (U. S.) Misc. Publ. 256 (U. S. Government Printing Office, Washington, D. C., 1964).
Proceedings of the Symposium on Recent Developments in Ellipsometry, edited by N. M. Bashara, A. B. Buckman, and A. C. Hall (North-Holland, Amsterdam, 1969).
M. Born and E. Wolf, Principles of Optics, 3rd ed. (Pergamon, New York, 1965), pp. 38 and 615.
Reference 1, p. 9.
Reference 3, p. 51.
A. B. Winterbottom, Optical Studies of Metal Surfaces (F. Burns, Trondheim, 1955).
R. A. W. Graves, J. Opt. Soc. Am. 59, 1225 (1969).
A. Wünsche, Ann. Phys. (Leipz.) 25, 201 (1970).
D. den Engelsen, J. Opt. Soc. Am. 61, 1460 (1971).
D. den Engelsen, J. Phys. Chem. 76, 3390 (1972).
F. Meyer, E. E. de Kluizenaar, and D. den Engelsen, J. Opt. Soc. Am. 63, 529 (1973).
R. M. A. Azzam and N. M. Bashara, J. Opt. Soc. Am. 62, 336 (1972).
R. M. A. Azzam and N. M. Bashara, Opt. Commun. 5, 5 (1972).
R. M. A. Azzam and N. M. Bashara, J. Opt. Soc. Am. 62, 1375A (1972); J. Opt. Soc. Am. 62, 1521 (1972).
S. Teitler and B. W. Henvis, J. Opt. Soc. Am. 60, 830 (1970).
D. W. Berreman, J. Opt. Soc. Am. 62, 502 (1972).
D. J. De Smet, J. Opt. Soc. Am. 63, 958 (1973).
R. M. A. Azzam and N. M. Bashara, J. Opt. Soc. Am. 62, 222 (1972).
R. M. A. Azzam and N. M. Bashara, J. Opt. Soc. Am. 63, 508A (1973); Appl. Phys. 2, 59 (1973).
Many other possible applications of generalized ellipsometry are mentioned in Ref. 14.
This method of obtaining and spacing multiple nulls is explained in Ref. 13. Other nulling schemes are detailed in Refs. 12 and 22.
R. M. A. Azzam, T. L. Bundy, and N. M. Bashara, Opt. Commun. 7, 110 (1973).
This assumes that the principal axes of both the absorption and the refraction indicatrices are coincident.
T. P. Sosnowski, Opt. Commun. 4, 408 (1972).
American Institute of Physics Handbook, 2nd ed. (McGraw-Hill, New York, 1963), Ch. 6, p. 18. These values were obtained by interpolating between values given in Table 6b-5a at wavelengths immediately above and below 6328 Å. If we use our values for N¯o, and N¯o [Eq. (15)], instead, the computed curves in Figs. 2 and 3 stay very much the same.
Note that three ellipsometer null measurements made on a single surface of a uniaxial absorping crystal positioned in one orientation are just enough to determine all of the refractive properties of such a crystal, even when the optic axis makes arbitrary unknown angles θ and ω (less than 90°) with the surface and the plane of incidence, respectively. In this more-general case, we have six known quantities (the magnitude and angles, or the real and imaginary parts of Rpp/Rss, Rps/Rss, and Rsp/Rss) and six unknown parameters (no, ko; ne, ke; ω and θ). However, in this case, the reflection coefficients are no longer given by Eqs. (11)–(13). They may be derived using the methods of Refs. 15 and 16.