Abstract

The optical constants of the manganese and bismuth constituents, and of the silicon monoxide protective coating of MnBi films have been measured. These values were used to compute the reflectance as a function of film thickness, which were compared with reflectance measurements at 6328 Å made during film deposition.

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  1. O. N. Tufte and D. Chen, IEEE Spectrum 10 (Feb.), 26 (1973).
  2. R. E. MacDonald and J. W. Beck, J. Appl. Phys. 40, 1429 (1969).
  3. G. Fan and J. H. Griener, J. Appl. Phys. 41, 1401 (1970).
  4. R. L. Aagard, T. C. Lee, and D. Chen, Appi. Opt. 11, 2133 (1972).
  5. B. Tsujiyama, S. Yoshi, and K. Nishiguchi, IEEE Trans. Magn. 4, 603 (1972).
  6. D. Chen, G. N. Otto, and F. M. Schmit, IEEE Trans. Magn. 9, 66 (1973).
  7. E. Jager and U. Ropke, Phys. Status Solidi 19, 529 (1973).
  8. G. Hass and C. D. Salzberg, J. Opt. Soc. Am. 44, 181 (1954).
  9. American Institute of Physics Handbook, Third Edition, edited by D. E. Gray (McGraw-Hill, New York, 1972), pp. 6–128.
  10. H. M. O'Bryan, J. Opt. Soc. Am. 26, 122 (1936).
  11. S. Esho, S. Nogucki, Y. Ono, and M. Nagao, Appl. Opt. 13, 779 (1974).

Aagard, R. L.

R. L. Aagard, T. C. Lee, and D. Chen, Appi. Opt. 11, 2133 (1972).

Beck, J. W.

R. E. MacDonald and J. W. Beck, J. Appl. Phys. 40, 1429 (1969).

Chen, D.

O. N. Tufte and D. Chen, IEEE Spectrum 10 (Feb.), 26 (1973).

R. L. Aagard, T. C. Lee, and D. Chen, Appi. Opt. 11, 2133 (1972).

D. Chen, G. N. Otto, and F. M. Schmit, IEEE Trans. Magn. 9, 66 (1973).

Esho, S.

S. Esho, S. Nogucki, Y. Ono, and M. Nagao, Appl. Opt. 13, 779 (1974).

Fan, G.

G. Fan and J. H. Griener, J. Appl. Phys. 41, 1401 (1970).

Griener, J. H.

G. Fan and J. H. Griener, J. Appl. Phys. 41, 1401 (1970).

Hass, G.

G. Hass and C. D. Salzberg, J. Opt. Soc. Am. 44, 181 (1954).

Jager, E.

E. Jager and U. Ropke, Phys. Status Solidi 19, 529 (1973).

Lee, T. C.

R. L. Aagard, T. C. Lee, and D. Chen, Appi. Opt. 11, 2133 (1972).

MacDonald, R. E.

R. E. MacDonald and J. W. Beck, J. Appl. Phys. 40, 1429 (1969).

Nagao, M.

S. Esho, S. Nogucki, Y. Ono, and M. Nagao, Appl. Opt. 13, 779 (1974).

Nishiguchi, K.

B. Tsujiyama, S. Yoshi, and K. Nishiguchi, IEEE Trans. Magn. 4, 603 (1972).

Nogucki, S.

S. Esho, S. Nogucki, Y. Ono, and M. Nagao, Appl. Opt. 13, 779 (1974).

O’Bryan, H. M.

H. M. O'Bryan, J. Opt. Soc. Am. 26, 122 (1936).

Ono, Y.

S. Esho, S. Nogucki, Y. Ono, and M. Nagao, Appl. Opt. 13, 779 (1974).

Otto, G. N.

D. Chen, G. N. Otto, and F. M. Schmit, IEEE Trans. Magn. 9, 66 (1973).

Ropke, U.

E. Jager and U. Ropke, Phys. Status Solidi 19, 529 (1973).

Salzberg, C. D.

G. Hass and C. D. Salzberg, J. Opt. Soc. Am. 44, 181 (1954).

Schmit, F. M.

D. Chen, G. N. Otto, and F. M. Schmit, IEEE Trans. Magn. 9, 66 (1973).

Tsujiyama, B.

B. Tsujiyama, S. Yoshi, and K. Nishiguchi, IEEE Trans. Magn. 4, 603 (1972).

Tufte, O. N.

O. N. Tufte and D. Chen, IEEE Spectrum 10 (Feb.), 26 (1973).

Yoshi, S.

B. Tsujiyama, S. Yoshi, and K. Nishiguchi, IEEE Trans. Magn. 4, 603 (1972).

Other (11)

O. N. Tufte and D. Chen, IEEE Spectrum 10 (Feb.), 26 (1973).

R. E. MacDonald and J. W. Beck, J. Appl. Phys. 40, 1429 (1969).

G. Fan and J. H. Griener, J. Appl. Phys. 41, 1401 (1970).

R. L. Aagard, T. C. Lee, and D. Chen, Appi. Opt. 11, 2133 (1972).

B. Tsujiyama, S. Yoshi, and K. Nishiguchi, IEEE Trans. Magn. 4, 603 (1972).

D. Chen, G. N. Otto, and F. M. Schmit, IEEE Trans. Magn. 9, 66 (1973).

E. Jager and U. Ropke, Phys. Status Solidi 19, 529 (1973).

G. Hass and C. D. Salzberg, J. Opt. Soc. Am. 44, 181 (1954).

American Institute of Physics Handbook, Third Edition, edited by D. E. Gray (McGraw-Hill, New York, 1972), pp. 6–128.

H. M. O'Bryan, J. Opt. Soc. Am. 26, 122 (1936).

S. Esho, S. Nogucki, Y. Ono, and M. Nagao, Appl. Opt. 13, 779 (1974).

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