Abstract

An interferometric method for measuring the electro-optic (EO) coefficients has been proposed. The method consists of the relative determination of the coefficient of a sample using a Mach–Zehnder interferometer, by compensating the phase shift due to the EO effect of the sample with that of a standard material. The technique offers a simple and highly sensitive measuring method for the EO coefficient. Values of the coefficients for typical EO crystals have been measured and are found to be in agreement with the previous data and with those obtained by another interferometric method proposed by Fujii and Sakudo.

© 1972 Optical Society of America

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References

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  1. J. D. Zook, D. Chen, and G. N. Otto, Appl. Phys. Letters 11, 159 (1967).
    [CrossRef]
  2. Y. Fujii and T. Sakudo, J. Appl. Phys. 41, 4118 (1970).
    [CrossRef]
  3. T. C. Lee, J. D. Heaps, and F. M. Schmit, Proc. IEEE 56, 1626 (1968).
    [CrossRef]
  4. “Standards on Piezoelectric Crystals, 1949,” Proc. IRE 37, 1378 (1949).
  5. O. G. Blokh, Kristallographia 7, 632 (1962) [Sov. Phys. Cryst. 7, 509 (1963)].
  6. P. V. Lenzo, E. G. Spencer, and K. Nassau, J. Opt.Soc. Am. 56, 633 (1966).
    [CrossRef]
  7. P. V. Lenzo, E. H. Turner, E. G. Spencer, and A. A. Ballman, Appl. Phys. Letters 8, 81 (1966).
    [CrossRef]
  8. E. H. Turner, Appl. Phys. Letters 8, 303 (1966).
    [CrossRef]
  9. I. P. Kaminow and E. H. Turner, Proc. IEEE 54, 1374 (1966).
    [CrossRef]
  10. R. W. Dixon, J. Appl. Phys. 38, 5149 (1967).
    [CrossRef]
  11. R. T. Smith and F. S. Welsh, J. Appl. Phys. 42, 2219 (1971).
    [CrossRef]
  12. K. F. Hulme, P. H. Davies, and V. M. Cound, J. Phys. C 2, 855 (1969).
    [CrossRef]

1971 (1)

R. T. Smith and F. S. Welsh, J. Appl. Phys. 42, 2219 (1971).
[CrossRef]

1970 (1)

Y. Fujii and T. Sakudo, J. Appl. Phys. 41, 4118 (1970).
[CrossRef]

1969 (1)

K. F. Hulme, P. H. Davies, and V. M. Cound, J. Phys. C 2, 855 (1969).
[CrossRef]

1968 (1)

T. C. Lee, J. D. Heaps, and F. M. Schmit, Proc. IEEE 56, 1626 (1968).
[CrossRef]

1967 (2)

J. D. Zook, D. Chen, and G. N. Otto, Appl. Phys. Letters 11, 159 (1967).
[CrossRef]

R. W. Dixon, J. Appl. Phys. 38, 5149 (1967).
[CrossRef]

1966 (4)

P. V. Lenzo, E. G. Spencer, and K. Nassau, J. Opt.Soc. Am. 56, 633 (1966).
[CrossRef]

P. V. Lenzo, E. H. Turner, E. G. Spencer, and A. A. Ballman, Appl. Phys. Letters 8, 81 (1966).
[CrossRef]

E. H. Turner, Appl. Phys. Letters 8, 303 (1966).
[CrossRef]

I. P. Kaminow and E. H. Turner, Proc. IEEE 54, 1374 (1966).
[CrossRef]

1962 (1)

O. G. Blokh, Kristallographia 7, 632 (1962) [Sov. Phys. Cryst. 7, 509 (1963)].

1949 (1)

“Standards on Piezoelectric Crystals, 1949,” Proc. IRE 37, 1378 (1949).

Ballman, A. A.

P. V. Lenzo, E. H. Turner, E. G. Spencer, and A. A. Ballman, Appl. Phys. Letters 8, 81 (1966).
[CrossRef]

Blokh, O. G.

O. G. Blokh, Kristallographia 7, 632 (1962) [Sov. Phys. Cryst. 7, 509 (1963)].

Chen, D.

J. D. Zook, D. Chen, and G. N. Otto, Appl. Phys. Letters 11, 159 (1967).
[CrossRef]

Cound, V. M.

K. F. Hulme, P. H. Davies, and V. M. Cound, J. Phys. C 2, 855 (1969).
[CrossRef]

Davies, P. H.

K. F. Hulme, P. H. Davies, and V. M. Cound, J. Phys. C 2, 855 (1969).
[CrossRef]

Dixon, R. W.

R. W. Dixon, J. Appl. Phys. 38, 5149 (1967).
[CrossRef]

Fujii, Y.

Y. Fujii and T. Sakudo, J. Appl. Phys. 41, 4118 (1970).
[CrossRef]

Heaps, J. D.

T. C. Lee, J. D. Heaps, and F. M. Schmit, Proc. IEEE 56, 1626 (1968).
[CrossRef]

Hulme, K. F.

K. F. Hulme, P. H. Davies, and V. M. Cound, J. Phys. C 2, 855 (1969).
[CrossRef]

Kaminow, I. P.

I. P. Kaminow and E. H. Turner, Proc. IEEE 54, 1374 (1966).
[CrossRef]

Lee, T. C.

T. C. Lee, J. D. Heaps, and F. M. Schmit, Proc. IEEE 56, 1626 (1968).
[CrossRef]

Lenzo, P. V.

P. V. Lenzo, E. G. Spencer, and K. Nassau, J. Opt.Soc. Am. 56, 633 (1966).
[CrossRef]

P. V. Lenzo, E. H. Turner, E. G. Spencer, and A. A. Ballman, Appl. Phys. Letters 8, 81 (1966).
[CrossRef]

Nassau, K.

P. V. Lenzo, E. G. Spencer, and K. Nassau, J. Opt.Soc. Am. 56, 633 (1966).
[CrossRef]

Otto, G. N.

J. D. Zook, D. Chen, and G. N. Otto, Appl. Phys. Letters 11, 159 (1967).
[CrossRef]

Sakudo, T.

Y. Fujii and T. Sakudo, J. Appl. Phys. 41, 4118 (1970).
[CrossRef]

Schmit, F. M.

T. C. Lee, J. D. Heaps, and F. M. Schmit, Proc. IEEE 56, 1626 (1968).
[CrossRef]

Smith, R. T.

R. T. Smith and F. S. Welsh, J. Appl. Phys. 42, 2219 (1971).
[CrossRef]

Spencer, E. G.

P. V. Lenzo, E. H. Turner, E. G. Spencer, and A. A. Ballman, Appl. Phys. Letters 8, 81 (1966).
[CrossRef]

P. V. Lenzo, E. G. Spencer, and K. Nassau, J. Opt.Soc. Am. 56, 633 (1966).
[CrossRef]

Turner, E. H.

P. V. Lenzo, E. H. Turner, E. G. Spencer, and A. A. Ballman, Appl. Phys. Letters 8, 81 (1966).
[CrossRef]

E. H. Turner, Appl. Phys. Letters 8, 303 (1966).
[CrossRef]

I. P. Kaminow and E. H. Turner, Proc. IEEE 54, 1374 (1966).
[CrossRef]

Welsh, F. S.

R. T. Smith and F. S. Welsh, J. Appl. Phys. 42, 2219 (1971).
[CrossRef]

Zook, J. D.

J. D. Zook, D. Chen, and G. N. Otto, Appl. Phys. Letters 11, 159 (1967).
[CrossRef]

Appl. Phys. Letters (3)

J. D. Zook, D. Chen, and G. N. Otto, Appl. Phys. Letters 11, 159 (1967).
[CrossRef]

P. V. Lenzo, E. H. Turner, E. G. Spencer, and A. A. Ballman, Appl. Phys. Letters 8, 81 (1966).
[CrossRef]

E. H. Turner, Appl. Phys. Letters 8, 303 (1966).
[CrossRef]

J. Appl. Phys. (3)

Y. Fujii and T. Sakudo, J. Appl. Phys. 41, 4118 (1970).
[CrossRef]

R. W. Dixon, J. Appl. Phys. 38, 5149 (1967).
[CrossRef]

R. T. Smith and F. S. Welsh, J. Appl. Phys. 42, 2219 (1971).
[CrossRef]

J. Opt.Soc. Am. (1)

P. V. Lenzo, E. G. Spencer, and K. Nassau, J. Opt.Soc. Am. 56, 633 (1966).
[CrossRef]

J. Phys. C (1)

K. F. Hulme, P. H. Davies, and V. M. Cound, J. Phys. C 2, 855 (1969).
[CrossRef]

Kristallographia (1)

O. G. Blokh, Kristallographia 7, 632 (1962) [Sov. Phys. Cryst. 7, 509 (1963)].

Proc. IEEE (2)

I. P. Kaminow and E. H. Turner, Proc. IEEE 54, 1374 (1966).
[CrossRef]

T. C. Lee, J. D. Heaps, and F. M. Schmit, Proc. IEEE 56, 1626 (1968).
[CrossRef]

Proc. IRE (1)

“Standards on Piezoelectric Crystals, 1949,” Proc. IRE 37, 1378 (1949).

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Figures (2)

F. 1
F. 1

Schematic diagram of the experimental setup.

F. 2
F. 2

Temperature dependence of the EO coefficients r13T and r33T for Sr0.46Ba0.54Nb2O6.

Tables (1)

Tables Icon

Table I Room-temperature values of rijT measured by the compensation method at 6328 Å.

Equations (2)

Equations on this page are rendered with MathJax. Learn more.

r s = ( n R 3 l R d s / n S 3 l S d R ) ( V R / V S ) r R ,
r i j T r i j S = p i k d j k ,