Abstract

An interferometric method for measuring the electro-optic (EO) coefficients has been proposed. The method consists of the relative determination of the coefficient of a sample using a Mach-Zehnder interferometer, by compensating the phase shift due to the EO effect of the sample with that of a standard material. The technique offers a simple and highly sensitive measuring method for the EO coefficient. Values of the coefficients for typical EO crystals have been measured and are found to be in agreement with the previous data and with those obtained by another interferometric method proposed by Fujii and Sakudo.

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