Abstract

The thickness and the complex refractive index of a moderately thin absorbing film on a transparent substrate of known optical properties can be determined by measuring the values of reflectance of the sample from opposite sides, and the transmittance. The technique and its use in measuring properties of films of RbI in the uv are described. Errors are reduced by averaging the values of thickness obtained at several wavelengths and by iterating the computations.

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References

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  1. O. S. Heavens, in Physics of Thin Films, Vol. 2, G. Hass and R. Thun, Eds. (Academic Press Inc., New York, 1964).
  2. A. Vašíček, Optics of Thin Films (North-Holland Publ. Co., Amsterdam, 1960).
  3. See, e.g., G. Meyer, Z. Physik 168, 169 (1962).

Heavens, O. S.

O. S. Heavens, in Physics of Thin Films, Vol. 2, G. Hass and R. Thun, Eds. (Academic Press Inc., New York, 1964).

Meyer, G.

See, e.g., G. Meyer, Z. Physik 168, 169 (1962).

Vašícek, A.

A. Vašíček, Optics of Thin Films (North-Holland Publ. Co., Amsterdam, 1960).

Other

O. S. Heavens, in Physics of Thin Films, Vol. 2, G. Hass and R. Thun, Eds. (Academic Press Inc., New York, 1964).

A. Vašíček, Optics of Thin Films (North-Holland Publ. Co., Amsterdam, 1960).

See, e.g., G. Meyer, Z. Physik 168, 169 (1962).

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