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  1. K. Shaklee, F. H. Pollak, and M. Cardona, Phys. Rev. Letters 15, 883 (1965).
    [CrossRef]
  2. J. Feinleib, Phys. Rev. Letters 16, 1200 (1966).
    [CrossRef]
  3. Y. Hamakawa, P. Handler, and F. A. Germano, Phys. Rev. 167, 709 (1968).
    [CrossRef]
  4. B. O. Seraphin, Surface Sci. 13, 136 (1969).
    [CrossRef]
  5. M. Steadman, Chem. Phys. Letters 2, 457 (1968).
    [CrossRef]
  6. D. E. Aspnes and A. Frova, Solid State Commun. 7, 155 (1969).
    [CrossRef]
  7. F. Evangelisti and A. Frova, Solid State Commun. 6, 621 (1968).
    [CrossRef]
  8. A. B. Buckman and N. M. Bashara, Phys. Rev. 174, 719 (1968).
    [CrossRef]
  9. E. Schmidt and W. H. Knausenberger, J. Opt. Soc. Am. 59, 857 (1969).
    [CrossRef]
  10. A. B. Buckman and N. M. Bashara, J. Opt. Soc. Am. 58, 700 (1968).
    [CrossRef]
  11. F. L. McCrackin and J. P. Colson, Ellipsometry in the Measurement of Surfaces and Thin Films. Natl. Bur. Std. (U. S.) Misc. Publ. 256 (U. S. Govt. Printing Office, Washington, D. C., 1964), p. 61.

1969 (3)

B. O. Seraphin, Surface Sci. 13, 136 (1969).
[CrossRef]

D. E. Aspnes and A. Frova, Solid State Commun. 7, 155 (1969).
[CrossRef]

E. Schmidt and W. H. Knausenberger, J. Opt. Soc. Am. 59, 857 (1969).
[CrossRef]

1968 (5)

A. B. Buckman and N. M. Bashara, J. Opt. Soc. Am. 58, 700 (1968).
[CrossRef]

F. Evangelisti and A. Frova, Solid State Commun. 6, 621 (1968).
[CrossRef]

A. B. Buckman and N. M. Bashara, Phys. Rev. 174, 719 (1968).
[CrossRef]

M. Steadman, Chem. Phys. Letters 2, 457 (1968).
[CrossRef]

Y. Hamakawa, P. Handler, and F. A. Germano, Phys. Rev. 167, 709 (1968).
[CrossRef]

1966 (1)

J. Feinleib, Phys. Rev. Letters 16, 1200 (1966).
[CrossRef]

1965 (1)

K. Shaklee, F. H. Pollak, and M. Cardona, Phys. Rev. Letters 15, 883 (1965).
[CrossRef]

Aspnes, D. E.

D. E. Aspnes and A. Frova, Solid State Commun. 7, 155 (1969).
[CrossRef]

Bashara, N. M.

A. B. Buckman and N. M. Bashara, Phys. Rev. 174, 719 (1968).
[CrossRef]

A. B. Buckman and N. M. Bashara, J. Opt. Soc. Am. 58, 700 (1968).
[CrossRef]

Buckman, A. B.

A. B. Buckman and N. M. Bashara, J. Opt. Soc. Am. 58, 700 (1968).
[CrossRef]

A. B. Buckman and N. M. Bashara, Phys. Rev. 174, 719 (1968).
[CrossRef]

Cardona, M.

K. Shaklee, F. H. Pollak, and M. Cardona, Phys. Rev. Letters 15, 883 (1965).
[CrossRef]

Colson, J. P.

F. L. McCrackin and J. P. Colson, Ellipsometry in the Measurement of Surfaces and Thin Films. Natl. Bur. Std. (U. S.) Misc. Publ. 256 (U. S. Govt. Printing Office, Washington, D. C., 1964), p. 61.

Evangelisti, F.

F. Evangelisti and A. Frova, Solid State Commun. 6, 621 (1968).
[CrossRef]

Feinleib, J.

J. Feinleib, Phys. Rev. Letters 16, 1200 (1966).
[CrossRef]

Frova, A.

D. E. Aspnes and A. Frova, Solid State Commun. 7, 155 (1969).
[CrossRef]

F. Evangelisti and A. Frova, Solid State Commun. 6, 621 (1968).
[CrossRef]

Germano, F. A.

Y. Hamakawa, P. Handler, and F. A. Germano, Phys. Rev. 167, 709 (1968).
[CrossRef]

Hamakawa, Y.

Y. Hamakawa, P. Handler, and F. A. Germano, Phys. Rev. 167, 709 (1968).
[CrossRef]

Handler, P.

Y. Hamakawa, P. Handler, and F. A. Germano, Phys. Rev. 167, 709 (1968).
[CrossRef]

Knausenberger, W. H.

E. Schmidt and W. H. Knausenberger, J. Opt. Soc. Am. 59, 857 (1969).
[CrossRef]

McCrackin, F. L.

F. L. McCrackin and J. P. Colson, Ellipsometry in the Measurement of Surfaces and Thin Films. Natl. Bur. Std. (U. S.) Misc. Publ. 256 (U. S. Govt. Printing Office, Washington, D. C., 1964), p. 61.

Pollak, F. H.

K. Shaklee, F. H. Pollak, and M. Cardona, Phys. Rev. Letters 15, 883 (1965).
[CrossRef]

Schmidt, E.

E. Schmidt and W. H. Knausenberger, J. Opt. Soc. Am. 59, 857 (1969).
[CrossRef]

Seraphin, B. O.

B. O. Seraphin, Surface Sci. 13, 136 (1969).
[CrossRef]

Shaklee, K.

K. Shaklee, F. H. Pollak, and M. Cardona, Phys. Rev. Letters 15, 883 (1965).
[CrossRef]

Steadman, M.

M. Steadman, Chem. Phys. Letters 2, 457 (1968).
[CrossRef]

Other (11)

K. Shaklee, F. H. Pollak, and M. Cardona, Phys. Rev. Letters 15, 883 (1965).
[CrossRef]

J. Feinleib, Phys. Rev. Letters 16, 1200 (1966).
[CrossRef]

Y. Hamakawa, P. Handler, and F. A. Germano, Phys. Rev. 167, 709 (1968).
[CrossRef]

B. O. Seraphin, Surface Sci. 13, 136 (1969).
[CrossRef]

M. Steadman, Chem. Phys. Letters 2, 457 (1968).
[CrossRef]

D. E. Aspnes and A. Frova, Solid State Commun. 7, 155 (1969).
[CrossRef]

F. Evangelisti and A. Frova, Solid State Commun. 6, 621 (1968).
[CrossRef]

A. B. Buckman and N. M. Bashara, Phys. Rev. 174, 719 (1968).
[CrossRef]

E. Schmidt and W. H. Knausenberger, J. Opt. Soc. Am. 59, 857 (1969).
[CrossRef]

A. B. Buckman and N. M. Bashara, J. Opt. Soc. Am. 58, 700 (1968).
[CrossRef]

F. L. McCrackin and J. P. Colson, Ellipsometry in the Measurement of Surfaces and Thin Films. Natl. Bur. Std. (U. S.) Misc. Publ. 256 (U. S. Govt. Printing Office, Washington, D. C., 1964), p. 61.

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Figures (2)

Fig. 1
Fig. 1

Changes of measured values of ψ and Δ vs time for Ge samples in 1N KCl. ●—Unetched, negative bias, 0.5-V modulation; ○—etched CP4, negative bias, 0.5-V modulation; △—etched CP4, zero bias, zero modulation; □—etched CP4, positive bias, 0.5-V modulation. Light wavelength is 5450 Å, angle of incidence 70°.

Fig. 2
Fig. 2

Spectra of δ1, the change of the real part, and −δ5, the change of the imaginary part, of the dielectric constant of 30 Ω-cm Ge, and normal-incidence electroreflectance δR/R, calculated by use of the model described in the text. ⋯ δ∊1 × 103, —— δ∊2 × 103, – – – (δR/R) × 105.

Equations (1)

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electrolyte Δ n d x 6 × 10 - 3 Ge Δ n d x 500 × 10 - 2 .