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  1. K. Shaklee, F. H. Pollak, and M. Cardona, Phys. Rev. Letters 15, 883 (1965).
  2. J. Feinleib, Phys. Rev. Letters 16, 1200 (1966).
  3. Y. Hamakawa, P. Handler, and F. A. Germano, Phys. Rev. 167, 709 (1968).
  4. B. O. Seraphin, Surface Sci. 13, 136 (1969).
  5. M. Steadman, Chem. Phys. Letters 2, 457 (1968).
  6. D. E. Aspnes and A. Frova, Solid State Commun. 7, 155 (1969).
  7. F. Evangelisti and A. Frova, Solid State Commun. 6, 621 (1968).
  8. A. B. Buckman and N. M. Bashara, Phys. Rev. 174, 719 (1968).
  9. E. Schmidt and W. H. Knausenberger, J. Opt. Soc. Am. 59, 857 (1969).
  10. A. B. Buckman and N. M. Bashara, J. Opt. Soc. Am. 58, 700 (1968).
  11. F. L. McCrackin and J. P. Colson, Ellipsometry in the Measurement of Surfaces and Thin Films. Natl. Bur. Std. (U. S.) Misc. Publ. 256 (U. S. Govt. Printing Office, Washington, D. C., 1964), p. 61.

Aspnes, D. E.

D. E. Aspnes and A. Frova, Solid State Commun. 7, 155 (1969).

Bashara, N. M.

A. B. Buckman and N. M. Bashara, Phys. Rev. 174, 719 (1968).

A. B. Buckman and N. M. Bashara, J. Opt. Soc. Am. 58, 700 (1968).

Buckman, A. B.

A. B. Buckman and N. M. Bashara, J. Opt. Soc. Am. 58, 700 (1968).

A. B. Buckman and N. M. Bashara, Phys. Rev. 174, 719 (1968).

Cardona, M.

K. Shaklee, F. H. Pollak, and M. Cardona, Phys. Rev. Letters 15, 883 (1965).

Colson, J. P.

F. L. McCrackin and J. P. Colson, Ellipsometry in the Measurement of Surfaces and Thin Films. Natl. Bur. Std. (U. S.) Misc. Publ. 256 (U. S. Govt. Printing Office, Washington, D. C., 1964), p. 61.

Evangelisti, F.

F. Evangelisti and A. Frova, Solid State Commun. 6, 621 (1968).

Feinleib, J.

J. Feinleib, Phys. Rev. Letters 16, 1200 (1966).

Frova, A.

F. Evangelisti and A. Frova, Solid State Commun. 6, 621 (1968).

D. E. Aspnes and A. Frova, Solid State Commun. 7, 155 (1969).

Germano, F. A.

Y. Hamakawa, P. Handler, and F. A. Germano, Phys. Rev. 167, 709 (1968).

Hamakawa, Y.

Y. Hamakawa, P. Handler, and F. A. Germano, Phys. Rev. 167, 709 (1968).

Handler, P.

Y. Hamakawa, P. Handler, and F. A. Germano, Phys. Rev. 167, 709 (1968).

Knausenberger, W. H.

E. Schmidt and W. H. Knausenberger, J. Opt. Soc. Am. 59, 857 (1969).

McCrackin, F. L.

F. L. McCrackin and J. P. Colson, Ellipsometry in the Measurement of Surfaces and Thin Films. Natl. Bur. Std. (U. S.) Misc. Publ. 256 (U. S. Govt. Printing Office, Washington, D. C., 1964), p. 61.

Pollak, F. H.

K. Shaklee, F. H. Pollak, and M. Cardona, Phys. Rev. Letters 15, 883 (1965).

Schmidt, E.

E. Schmidt and W. H. Knausenberger, J. Opt. Soc. Am. 59, 857 (1969).

Seraphin, B. O.

B. O. Seraphin, Surface Sci. 13, 136 (1969).

Shaklee, K.

K. Shaklee, F. H. Pollak, and M. Cardona, Phys. Rev. Letters 15, 883 (1965).

Steadman, M.

M. Steadman, Chem. Phys. Letters 2, 457 (1968).

Other

K. Shaklee, F. H. Pollak, and M. Cardona, Phys. Rev. Letters 15, 883 (1965).

J. Feinleib, Phys. Rev. Letters 16, 1200 (1966).

Y. Hamakawa, P. Handler, and F. A. Germano, Phys. Rev. 167, 709 (1968).

B. O. Seraphin, Surface Sci. 13, 136 (1969).

M. Steadman, Chem. Phys. Letters 2, 457 (1968).

D. E. Aspnes and A. Frova, Solid State Commun. 7, 155 (1969).

F. Evangelisti and A. Frova, Solid State Commun. 6, 621 (1968).

A. B. Buckman and N. M. Bashara, Phys. Rev. 174, 719 (1968).

E. Schmidt and W. H. Knausenberger, J. Opt. Soc. Am. 59, 857 (1969).

A. B. Buckman and N. M. Bashara, J. Opt. Soc. Am. 58, 700 (1968).

F. L. McCrackin and J. P. Colson, Ellipsometry in the Measurement of Surfaces and Thin Films. Natl. Bur. Std. (U. S.) Misc. Publ. 256 (U. S. Govt. Printing Office, Washington, D. C., 1964), p. 61.

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