Abstract

The optical constants of rapidly grown silver sulfide films approximately 400 Å thick have been determined in the wavelength range 0.28–2.5 µ using three independent methods. A fourth method was used to obtain values of <i>n</i> and <i>k</i> for thin (40 Å), naturally grown silver sulfide films on opaque silver in the wavelength range 0.34–0.60 µ. Although these results are probably not representative of bulk silver sulfide, they should be approximately correct for tarnish films on silver. Thus, they can be used to calculate the reflectance as a function of wavelength for silver covered with tarnish films of various thicknesses. The measured reflectances of two such films were in reasonable agreement with the calculations, and the reflectance of heavily tarnished silver was essentially the same as that of fresh silver in the infrared. The measured optical constants of silver sulfide can also be used to calculate the thickness of thin tarnish films from ellipsometric measurements, and to calculate the shift in the surface plasma-resonance frequency when silver is covered with a thin tarnish film.

PDF Article

References

  • View by:
  • |
  • |

  1. H. E. Bennett, R. L. Peck, D. K. Burge, and J. M. Bennett, J. Appl. Phys. 40, 3351 (1969).
  2. H. E. Bennett, D. K. Burge, R. L. Peck, and J. M. Bennett, J. Opt. Soc. Am. 59, 675 (1969).
  3. D. K. Burge, J. M. Bennett, R. L. Peck, and H. E. Bennett, Surface Sci. 16, 303 (1969).
  4. J. L. Stanford, H. E. Bennett, J. M. Bennett, E. J. Ashley, and E. T. Arakawa, Bull. Am. Phys. Soc. 13, 989 (1968).
  5. P. Junod, Helv. Phys. Acta 32, 567 (1959).
  6. R. Bailly, Am. Mineralogist 33, 519 (1948).
  7. F. L. McCrackin and J. P. Colson, in Ellipsometry in the Measurement of Surfaces and Thin Films, Symposium Proceedings, Washington, 1963, E. Passaglia, R. R. Stromberg, and J. Kruger, Eds., Natl. Bur. Stds. (U. S.) Misc. Publ. 256 (U. S. Govt. Printing Office, Washington, D. C., 1964), p. 61.
  8. H. E. Bennett, J. M. Bennett, and E. J. Ashley, J. Opt. Soc. Am. 52, 1245 (1962).
  9. H. E. Bennett and E. J. Ashley, Appl. Opt. 4, 221 (1965).
  10. H. E. Bennett and J. M. Bennett, in Physics of Thin Films, Vol. 4, G. Hass and R. E. Thun, Eds. (Academic Press Inc., New York, 1967), pp. 12–17.
  11. H. E. Bennett and J. F. Roberts, J. Opt. Soc. Am. 54, 568A (1964).
  12. H. E. Bennett and W. F. Koehler, J, Opt. Soc. Am. 50, 1 (1960).
  13. See Ref. 10, pp. 31–37.
  14. J. M. Bennett and M. J. Booty, Appl. Opt. 5, 41 (1966).
  15. See Ref. 10, p. 42.
  16. P. H. Berning, in Physics of Thin Films, Vol. 1, G. HaSs, Ed. (Academic Press Inc., New York, 1963), p. 69.
  17. J. A. Horton and W. N. Hansen, Anal. Chem. 39, 1097 (1967).
  18. The Cary 14R spectrophotometer actually measured absorbance [equal to log10(1/R)] and the computer program was set up accordingly, but the method basically deals with internal reflectances.
  19. P.-O. Nilsson, Appl. Opt. 7, 435 (1968).
  20. See Ref. 10, pp. 17–18.
  21. J. M. Bennett and M. J. Booty, Appl. Opt. 8, 2366 (1969).
  22. R. H. Huebner, E. T. Arakawa, R. A. MacRae, and R. N. Hamm, J. Opt. Soc. Am. 54, 1434 (1964).
  23. J. M. Bennett, E. J. Ashley, and H. E. Bennett, Appl. Opt. 4, 961 (1965)
  24. J. L. Stanford, J. Opt. Soc. Am. 60, 49 (1970).
  25. W. F. Koehler, J. Opt. Soc. Am. 45, 934 (1955).

Arakawa, E. T.

J. L. Stanford, H. E. Bennett, J. M. Bennett, E. J. Ashley, and E. T. Arakawa, Bull. Am. Phys. Soc. 13, 989 (1968).

R. H. Huebner, E. T. Arakawa, R. A. MacRae, and R. N. Hamm, J. Opt. Soc. Am. 54, 1434 (1964).

Ashley, E. J.

J. M. Bennett, E. J. Ashley, and H. E. Bennett, Appl. Opt. 4, 961 (1965)

J. L. Stanford, H. E. Bennett, J. M. Bennett, E. J. Ashley, and E. T. Arakawa, Bull. Am. Phys. Soc. 13, 989 (1968).

H. E. Bennett, J. M. Bennett, and E. J. Ashley, J. Opt. Soc. Am. 52, 1245 (1962).

H. E. Bennett and E. J. Ashley, Appl. Opt. 4, 221 (1965).

Bailly, R.

R. Bailly, Am. Mineralogist 33, 519 (1948).

Bennett, H. E.

H. E. Bennett and E. J. Ashley, Appl. Opt. 4, 221 (1965).

H. E. Bennett, J. M. Bennett, and E. J. Ashley, J. Opt. Soc. Am. 52, 1245 (1962).

H. E. Bennett and J. M. Bennett, in Physics of Thin Films, Vol. 4, G. Hass and R. E. Thun, Eds. (Academic Press Inc., New York, 1967), pp. 12–17.

H. E. Bennett and J. F. Roberts, J. Opt. Soc. Am. 54, 568A (1964).

H. E. Bennett and W. F. Koehler, J, Opt. Soc. Am. 50, 1 (1960).

J. L. Stanford, H. E. Bennett, J. M. Bennett, E. J. Ashley, and E. T. Arakawa, Bull. Am. Phys. Soc. 13, 989 (1968).

D. K. Burge, J. M. Bennett, R. L. Peck, and H. E. Bennett, Surface Sci. 16, 303 (1969).

H. E. Bennett, R. L. Peck, D. K. Burge, and J. M. Bennett, J. Appl. Phys. 40, 3351 (1969).

H. E. Bennett, D. K. Burge, R. L. Peck, and J. M. Bennett, J. Opt. Soc. Am. 59, 675 (1969).

J. M. Bennett, E. J. Ashley, and H. E. Bennett, Appl. Opt. 4, 961 (1965)

Bennett, J. M.

J. M. Bennett, E. J. Ashley, and H. E. Bennett, Appl. Opt. 4, 961 (1965)

J. M. Bennett and M. J. Booty, Appl. Opt. 8, 2366 (1969).

H. E. Bennett, D. K. Burge, R. L. Peck, and J. M. Bennett, J. Opt. Soc. Am. 59, 675 (1969).

H. E. Bennett, R. L. Peck, D. K. Burge, and J. M. Bennett, J. Appl. Phys. 40, 3351 (1969).

D. K. Burge, J. M. Bennett, R. L. Peck, and H. E. Bennett, Surface Sci. 16, 303 (1969).

J. L. Stanford, H. E. Bennett, J. M. Bennett, E. J. Ashley, and E. T. Arakawa, Bull. Am. Phys. Soc. 13, 989 (1968).

J. M. Bennett and M. J. Booty, Appl. Opt. 5, 41 (1966).

H. E. Bennett and J. M. Bennett, in Physics of Thin Films, Vol. 4, G. Hass and R. E. Thun, Eds. (Academic Press Inc., New York, 1967), pp. 12–17.

H. E. Bennett, J. M. Bennett, and E. J. Ashley, J. Opt. Soc. Am. 52, 1245 (1962).

Berning, P. H.

P. H. Berning, in Physics of Thin Films, Vol. 1, G. HaSs, Ed. (Academic Press Inc., New York, 1963), p. 69.

Booty, M. J.

J. M. Bennett and M. J. Booty, Appl. Opt. 8, 2366 (1969).

J. M. Bennett and M. J. Booty, Appl. Opt. 5, 41 (1966).

Burge, D. K.

H. E. Bennett, R. L. Peck, D. K. Burge, and J. M. Bennett, J. Appl. Phys. 40, 3351 (1969).

D. K. Burge, J. M. Bennett, R. L. Peck, and H. E. Bennett, Surface Sci. 16, 303 (1969).

H. E. Bennett, D. K. Burge, R. L. Peck, and J. M. Bennett, J. Opt. Soc. Am. 59, 675 (1969).

Colson, J. P.

F. L. McCrackin and J. P. Colson, in Ellipsometry in the Measurement of Surfaces and Thin Films, Symposium Proceedings, Washington, 1963, E. Passaglia, R. R. Stromberg, and J. Kruger, Eds., Natl. Bur. Stds. (U. S.) Misc. Publ. 256 (U. S. Govt. Printing Office, Washington, D. C., 1964), p. 61.

Hamm, R. N.

R. H. Huebner, E. T. Arakawa, R. A. MacRae, and R. N. Hamm, J. Opt. Soc. Am. 54, 1434 (1964).

Hansen, W. N.

J. A. Horton and W. N. Hansen, Anal. Chem. 39, 1097 (1967).

Horton, J. A.

J. A. Horton and W. N. Hansen, Anal. Chem. 39, 1097 (1967).

Huebner, R. H.

R. H. Huebner, E. T. Arakawa, R. A. MacRae, and R. N. Hamm, J. Opt. Soc. Am. 54, 1434 (1964).

Junod, P.

P. Junod, Helv. Phys. Acta 32, 567 (1959).

Koehler, W. F.

H. E. Bennett and W. F. Koehler, J, Opt. Soc. Am. 50, 1 (1960).

W. F. Koehler, J. Opt. Soc. Am. 45, 934 (1955).

MacRae, R. A.

R. H. Huebner, E. T. Arakawa, R. A. MacRae, and R. N. Hamm, J. Opt. Soc. Am. 54, 1434 (1964).

McCrackin, F. L.

F. L. McCrackin and J. P. Colson, in Ellipsometry in the Measurement of Surfaces and Thin Films, Symposium Proceedings, Washington, 1963, E. Passaglia, R. R. Stromberg, and J. Kruger, Eds., Natl. Bur. Stds. (U. S.) Misc. Publ. 256 (U. S. Govt. Printing Office, Washington, D. C., 1964), p. 61.

Nilsson, P.-O.

P.-O. Nilsson, Appl. Opt. 7, 435 (1968).

Peck, R. L.

D. K. Burge, J. M. Bennett, R. L. Peck, and H. E. Bennett, Surface Sci. 16, 303 (1969).

H. E. Bennett, D. K. Burge, R. L. Peck, and J. M. Bennett, J. Opt. Soc. Am. 59, 675 (1969).

H. E. Bennett, R. L. Peck, D. K. Burge, and J. M. Bennett, J. Appl. Phys. 40, 3351 (1969).

Roberts, J. F.

H. E. Bennett and J. F. Roberts, J. Opt. Soc. Am. 54, 568A (1964).

Stanford, J. L.

J. L. Stanford, H. E. Bennett, J. M. Bennett, E. J. Ashley, and E. T. Arakawa, Bull. Am. Phys. Soc. 13, 989 (1968).

J. L. Stanford, J. Opt. Soc. Am. 60, 49 (1970).

Other (25)

H. E. Bennett, R. L. Peck, D. K. Burge, and J. M. Bennett, J. Appl. Phys. 40, 3351 (1969).

H. E. Bennett, D. K. Burge, R. L. Peck, and J. M. Bennett, J. Opt. Soc. Am. 59, 675 (1969).

D. K. Burge, J. M. Bennett, R. L. Peck, and H. E. Bennett, Surface Sci. 16, 303 (1969).

J. L. Stanford, H. E. Bennett, J. M. Bennett, E. J. Ashley, and E. T. Arakawa, Bull. Am. Phys. Soc. 13, 989 (1968).

P. Junod, Helv. Phys. Acta 32, 567 (1959).

R. Bailly, Am. Mineralogist 33, 519 (1948).

F. L. McCrackin and J. P. Colson, in Ellipsometry in the Measurement of Surfaces and Thin Films, Symposium Proceedings, Washington, 1963, E. Passaglia, R. R. Stromberg, and J. Kruger, Eds., Natl. Bur. Stds. (U. S.) Misc. Publ. 256 (U. S. Govt. Printing Office, Washington, D. C., 1964), p. 61.

H. E. Bennett, J. M. Bennett, and E. J. Ashley, J. Opt. Soc. Am. 52, 1245 (1962).

H. E. Bennett and E. J. Ashley, Appl. Opt. 4, 221 (1965).

H. E. Bennett and J. M. Bennett, in Physics of Thin Films, Vol. 4, G. Hass and R. E. Thun, Eds. (Academic Press Inc., New York, 1967), pp. 12–17.

H. E. Bennett and J. F. Roberts, J. Opt. Soc. Am. 54, 568A (1964).

H. E. Bennett and W. F. Koehler, J, Opt. Soc. Am. 50, 1 (1960).

See Ref. 10, pp. 31–37.

J. M. Bennett and M. J. Booty, Appl. Opt. 5, 41 (1966).

See Ref. 10, p. 42.

P. H. Berning, in Physics of Thin Films, Vol. 1, G. HaSs, Ed. (Academic Press Inc., New York, 1963), p. 69.

J. A. Horton and W. N. Hansen, Anal. Chem. 39, 1097 (1967).

The Cary 14R spectrophotometer actually measured absorbance [equal to log10(1/R)] and the computer program was set up accordingly, but the method basically deals with internal reflectances.

P.-O. Nilsson, Appl. Opt. 7, 435 (1968).

See Ref. 10, pp. 17–18.

J. M. Bennett and M. J. Booty, Appl. Opt. 8, 2366 (1969).

R. H. Huebner, E. T. Arakawa, R. A. MacRae, and R. N. Hamm, J. Opt. Soc. Am. 54, 1434 (1964).

J. M. Bennett, E. J. Ashley, and H. E. Bennett, Appl. Opt. 4, 961 (1965)

J. L. Stanford, J. Opt. Soc. Am. 60, 49 (1970).

W. F. Koehler, J. Opt. Soc. Am. 45, 934 (1955).

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.