Abstract

Methods of determining the principal optical constants of biaxial and uniaxial crystals are presented, using either ellipsometric or reflectance measurements.

© 1969 Optical Society of America

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  1. A. P. Lenham, Proc. Phys. Soc. (London) 82, 933 (1963).
  2. R. T. Jacobsen and M. Kerker, J. Opt. Soc. Am. 57, 751 (1967).
  3. A. P. Lenham and D. M. Treherne, J. Opt. Soc. Am. 55, 1072 (1965).
  4. A. H. Lettington, in Proc. 1st Intern. Colloq. Opt. Prop. Electronic Structure of Metals and Alloys, F. Abelés, Ed. (North-Holland Publ. Co., Amsterdam, 1966), p. 147.
  5. ε is used in preference to the complex refractive index nik [ε=(n-ik2)] in these equations since it leads in general to a more compact form of the equations.
  6. J. R. Beattie and G. K. T. Conn, Phil. Mag. 46, 231 (1955).
  7. See any standard text on numerical analysis, e.g., A. D Booth, Numerical Methods (Butterworths Scientific Publications Ltd. London, 1957).
  8. R. H. W. Graves and A. P. Lenham, J. Opt. Soc. Am. 58, 884 (1968).

Beattie, J. R.

J. R. Beattie and G. K. T. Conn, Phil. Mag. 46, 231 (1955).

Booth, A. D

See any standard text on numerical analysis, e.g., A. D Booth, Numerical Methods (Butterworths Scientific Publications Ltd. London, 1957).

Conn, G. K. T.

J. R. Beattie and G. K. T. Conn, Phil. Mag. 46, 231 (1955).

Graves, R. H. W.

R. H. W. Graves and A. P. Lenham, J. Opt. Soc. Am. 58, 884 (1968).

Jacobsen, R. T.

R. T. Jacobsen and M. Kerker, J. Opt. Soc. Am. 57, 751 (1967).

Kerker, M.

R. T. Jacobsen and M. Kerker, J. Opt. Soc. Am. 57, 751 (1967).

Lenham, A. P.

A. P. Lenham and D. M. Treherne, J. Opt. Soc. Am. 55, 1072 (1965).

A. P. Lenham, Proc. Phys. Soc. (London) 82, 933 (1963).

R. H. W. Graves and A. P. Lenham, J. Opt. Soc. Am. 58, 884 (1968).

Lettington, A. H.

A. H. Lettington, in Proc. 1st Intern. Colloq. Opt. Prop. Electronic Structure of Metals and Alloys, F. Abelés, Ed. (North-Holland Publ. Co., Amsterdam, 1966), p. 147.

Treherne, D. M.

A. P. Lenham and D. M. Treherne, J. Opt. Soc. Am. 55, 1072 (1965).

Other (8)

A. P. Lenham, Proc. Phys. Soc. (London) 82, 933 (1963).

R. T. Jacobsen and M. Kerker, J. Opt. Soc. Am. 57, 751 (1967).

A. P. Lenham and D. M. Treherne, J. Opt. Soc. Am. 55, 1072 (1965).

A. H. Lettington, in Proc. 1st Intern. Colloq. Opt. Prop. Electronic Structure of Metals and Alloys, F. Abelés, Ed. (North-Holland Publ. Co., Amsterdam, 1966), p. 147.

ε is used in preference to the complex refractive index nik [ε=(n-ik2)] in these equations since it leads in general to a more compact form of the equations.

J. R. Beattie and G. K. T. Conn, Phil. Mag. 46, 231 (1955).

See any standard text on numerical analysis, e.g., A. D Booth, Numerical Methods (Butterworths Scientific Publications Ltd. London, 1957).

R. H. W. Graves and A. P. Lenham, J. Opt. Soc. Am. 58, 884 (1968).

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