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Figures (2)

Fig. 1
Fig. 1

Dependence of 2νκd as functions of wavelength for Cu films. ν = refractive index of the film, κ attenuation index, d thickness.——— partial pressure O2 = 10−9 torr; - - - partial pressure O2 = 10−3 torr; · · · partial pressure O2 = 200 torr; ● curves corresponding to 1.2-nm film; ○ curves corresponding to 3.6-nm film; × curves corresponding to 8.6-nm film.

Fig. 2
Fig. 2

Dependence of 2/q as a function for different values of a/a′. 2 = 7. is the permittivity of cuprous oxide; 1 the permittivity of Cu.