Abstract

The ordinary and extraordinary indices of refraction of single-crystal selenium, at ambient room temperature, were determined by the direct minimum-deviation technique. Measurements made at four different infrared wavelengths are compared with other investigations.

© 1969 Optical Society of America

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References

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  1. C. K. N. Patel, Phys. Rev. Letters 16, 613 (1966).
    [Crossref]
  2. C. K. N. Patel, Appl. Phys. Letters 9, 332 (1966).
    [Crossref]
  3. F. M. Johnson and J. A. Duardo, Laser Focus 3, 31 (1967).
  4. R. Caldwell and H. Y. Fan, Phys. Rev. 114, 664 (1959).
    [Crossref]
  5. V. Prosser, Czech J. Phys. B10, 306 (1960).
    [Crossref]
  6. C. H. Skinner, Phys. Rev. 9, 148 (1917).
    [Crossref]
  7. H. Gobrecht and A. Tausend, Z. Physik 161, 205 (1961).
    [Crossref]
  8. F. Eckart and W. Henrion, Phys. Stat. Sol. 2, 841 (1962).
    [Crossref]
  9. I. H. Malitson, J. Opt. Soc. Am. 55, 1205 (1965).
    [Crossref]

1967 (1)

F. M. Johnson and J. A. Duardo, Laser Focus 3, 31 (1967).

1966 (2)

C. K. N. Patel, Phys. Rev. Letters 16, 613 (1966).
[Crossref]

C. K. N. Patel, Appl. Phys. Letters 9, 332 (1966).
[Crossref]

1965 (1)

1962 (1)

F. Eckart and W. Henrion, Phys. Stat. Sol. 2, 841 (1962).
[Crossref]

1961 (1)

H. Gobrecht and A. Tausend, Z. Physik 161, 205 (1961).
[Crossref]

1960 (1)

V. Prosser, Czech J. Phys. B10, 306 (1960).
[Crossref]

1959 (1)

R. Caldwell and H. Y. Fan, Phys. Rev. 114, 664 (1959).
[Crossref]

1917 (1)

C. H. Skinner, Phys. Rev. 9, 148 (1917).
[Crossref]

Caldwell, R.

R. Caldwell and H. Y. Fan, Phys. Rev. 114, 664 (1959).
[Crossref]

Duardo, J. A.

F. M. Johnson and J. A. Duardo, Laser Focus 3, 31 (1967).

Eckart, F.

F. Eckart and W. Henrion, Phys. Stat. Sol. 2, 841 (1962).
[Crossref]

Fan, H. Y.

R. Caldwell and H. Y. Fan, Phys. Rev. 114, 664 (1959).
[Crossref]

Gobrecht, H.

H. Gobrecht and A. Tausend, Z. Physik 161, 205 (1961).
[Crossref]

Henrion, W.

F. Eckart and W. Henrion, Phys. Stat. Sol. 2, 841 (1962).
[Crossref]

Johnson, F. M.

F. M. Johnson and J. A. Duardo, Laser Focus 3, 31 (1967).

Malitson, I. H.

Patel, C. K. N.

C. K. N. Patel, Phys. Rev. Letters 16, 613 (1966).
[Crossref]

C. K. N. Patel, Appl. Phys. Letters 9, 332 (1966).
[Crossref]

Prosser, V.

V. Prosser, Czech J. Phys. B10, 306 (1960).
[Crossref]

Skinner, C. H.

C. H. Skinner, Phys. Rev. 9, 148 (1917).
[Crossref]

Tausend, A.

H. Gobrecht and A. Tausend, Z. Physik 161, 205 (1961).
[Crossref]

Appl. Phys. Letters (1)

C. K. N. Patel, Appl. Phys. Letters 9, 332 (1966).
[Crossref]

Czech J. Phys. (1)

V. Prosser, Czech J. Phys. B10, 306 (1960).
[Crossref]

J. Opt. Soc. Am. (1)

Laser Focus (1)

F. M. Johnson and J. A. Duardo, Laser Focus 3, 31 (1967).

Phys. Rev. (2)

R. Caldwell and H. Y. Fan, Phys. Rev. 114, 664 (1959).
[Crossref]

C. H. Skinner, Phys. Rev. 9, 148 (1917).
[Crossref]

Phys. Rev. Letters (1)

C. K. N. Patel, Phys. Rev. Letters 16, 613 (1966).
[Crossref]

Phys. Stat. Sol. (1)

F. Eckart and W. Henrion, Phys. Stat. Sol. 2, 841 (1962).
[Crossref]

Z. Physik (1)

H. Gobrecht and A. Tausend, Z. Physik 161, 205 (1961).
[Crossref]

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Figures (3)

Fig. 1
Fig. 1

Apparatus for measurement of angle of minimum deviation L = LaserAS = Alignment slitRSA = Radiation shield with apertureP = PrismT = TurntableFB = Fixed baseRA = Rotatable armBFL = Barium fluoride lensES = Exit slitD = Detector fixed to moving armKM = Keithly microvoltmeterΔ = Angle of deviation.

Fig. 2
Fig. 2

Comparison of the present results for the ordinary index of refraction (n0) of single-crystal selenium (⊙) with the results of (a) Caldwell and Fan,4 (b) Prosser,5 (c) Skinner,6 (d) Gobrecht and Tausend,7 and (e) Eckart and Henrion.8

Fig. 3
Fig. 3

Comparison of the present results for the extraordinary index of refraction (ne) of single-crystal selenium (⊙) with the results of (a) Caldwell and Fan,4 (b) Prosser,5 (c) Skinner,6 (d) Gobrecht and Tausend,7 and (e) Eckart and Henrion.8

Tables (1)

Tables Icon

Table I Refractive indices of selenium at 23°C (±2°C).

Equations (4)

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n 4880 ( experimental ) = 1.463 ± 0.001.
n 4880 ( calculated ) = 1.46302.
sin 2 θ m = [ ( n 0 ω ) - 2 - ( n 0 2 ω ) - 2 ] / [ ( n 0 ω ) - 2 - ( n e ω ) - 2 ] ;
n 0 ω = 2.64 ,             n e ω = 3.41 ,             n 0 2 ω = 2.645.