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  1. J. H. Altman, Appl. Opt. 3, 35 (1964).
  2. J. A. Eyer, Appl. Spectry. 14, 4 (1960).
  3. When the measuring microdensitometer introduces a component of noise that is gaussian with standard deviation σM, we have [equation] since in the making of the overall measurement, the variances of the gaussian processes add.
  4. R. C. Jones, Phot. Sci. Eng. 2, 57 (1958).

Altman, J. H.

J. H. Altman, Appl. Opt. 3, 35 (1964).

Eyer, J. A.

J. A. Eyer, Appl. Spectry. 14, 4 (1960).

Jones, R. C.

R. C. Jones, Phot. Sci. Eng. 2, 57 (1958).

Other (4)

J. H. Altman, Appl. Opt. 3, 35 (1964).

J. A. Eyer, Appl. Spectry. 14, 4 (1960).

When the measuring microdensitometer introduces a component of noise that is gaussian with standard deviation σM, we have [equation] since in the making of the overall measurement, the variances of the gaussian processes add.

R. C. Jones, Phot. Sci. Eng. 2, 57 (1958).

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