Abstract

The optical constants n and k for polystyrene in both bulk and chemically deposited thin-film form have been measured by the reflectance vs angle of incidence technique in the wavelength region from 584 to 2000 Å. Four angles of incidence were used, and the effects of monochromator polarization were eliminated experimentally. The results differ from previously published data for the bulk form. The electron-energy-loss function - Im(1/∊) was calculated from <i>n</i> and <i>k</i> determined for the thin films and compared with values obtained previously by characteristic electron-energy-loss techniques. These two methods yield the same structure in the energy-loss function; however, there remains some difference in the magnitude of the 6.9-eV loss relative to the background.

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  1. R. P. Madden in Physics of Thin Films, Vol. I, G. Hass and R. Thun, Eds. (Academic Press Inc., New York, 1963) p. 123.
  2. U. Fano, Ann. Rev. Nucl. Sci. 13, 1 (1963), and references therein.
  3. H. R. Philipp and H. E. Ehrenreich, Phys. Rev. 129, 1550 (1963); H. Raether, Springer Tracts in Mod. Phys. 38, 84 (1965); R. E. LaVilla and H. Mendlowitz, Appl. Opt. 6, 61 (1967).
  4. M. Creuzburg, Z. Physik 196, 433 (1966).
  5. J. G. Carter, T. M. Jelinek, R. N. Hamm, and R. D. Birkhoff, J. Chem. Phys. 44, 2266 (1966).
  6. N. Swanson and C. J. Powell, J. Chem. Phys. 39, 630 (1963); see also calculations of ∊1, and ∊2 based on these measurements, R. E. LaVilla and H. Mendlowitz J. Phys. (Paris) 25, 114 (1964).
  7. K. Rabinovitch, L. R. Canfield, and R. P. Madden, Appl. Opt. 4, 1005 (1965).
  8. R. S. M. Revell and A. W. Agar, Brit. J. Appl. Phys. 6, 23 (1955).
  9. S. Tolansky, Multiple Beam Interferometry of Surfaces and Films (The Clarendon Press, Oxford, 1948).
  10. A convenient form of Fresnel's equations can be found in Ref. 11.
  11. R. Tousey, J. Opt. Soc. Am. 29, 235 (1939).
  12. D. W. Juenker, J. Opt. Soc. Am. 55, 295 (1965).
  13. W. R. Hunter, J. Opt. Soc. Am. 55, 1197 (1965).
  14. N. Swanson and C. J. Powell (private communication).
  15. D. M. Roessler and W. C. Walker, J. Phys. Chem Solids 28, 1507 (1967).

Fano, U.

U. Fano, Ann. Rev. Nucl. Sci. 13, 1 (1963), and references therein.

Agar, A. W.

R. S. M. Revell and A. W. Agar, Brit. J. Appl. Phys. 6, 23 (1955).

Birkhoff, R. D.

J. G. Carter, T. M. Jelinek, R. N. Hamm, and R. D. Birkhoff, J. Chem. Phys. 44, 2266 (1966).

Canfield, L. R.

K. Rabinovitch, L. R. Canfield, and R. P. Madden, Appl. Opt. 4, 1005 (1965).

Carter, J. G.

J. G. Carter, T. M. Jelinek, R. N. Hamm, and R. D. Birkhoff, J. Chem. Phys. 44, 2266 (1966).

Creuzburg, M.

M. Creuzburg, Z. Physik 196, 433 (1966).

Ehrenreich, H. E.

H. R. Philipp and H. E. Ehrenreich, Phys. Rev. 129, 1550 (1963); H. Raether, Springer Tracts in Mod. Phys. 38, 84 (1965); R. E. LaVilla and H. Mendlowitz, Appl. Opt. 6, 61 (1967).

Hamm, R. N.

J. G. Carter, T. M. Jelinek, R. N. Hamm, and R. D. Birkhoff, J. Chem. Phys. 44, 2266 (1966).

Hunter, W. R.

W. R. Hunter, J. Opt. Soc. Am. 55, 1197 (1965).

Jelinek, T. M.

J. G. Carter, T. M. Jelinek, R. N. Hamm, and R. D. Birkhoff, J. Chem. Phys. 44, 2266 (1966).

Juenker, D. W.

D. W. Juenker, J. Opt. Soc. Am. 55, 295 (1965).

Madden, R. P.

R. P. Madden in Physics of Thin Films, Vol. I, G. Hass and R. Thun, Eds. (Academic Press Inc., New York, 1963) p. 123.

K. Rabinovitch, L. R. Canfield, and R. P. Madden, Appl. Opt. 4, 1005 (1965).

Philipp, H. R.

H. R. Philipp and H. E. Ehrenreich, Phys. Rev. 129, 1550 (1963); H. Raether, Springer Tracts in Mod. Phys. 38, 84 (1965); R. E. LaVilla and H. Mendlowitz, Appl. Opt. 6, 61 (1967).

Powell, C. J.

N. Swanson and C. J. Powell, J. Chem. Phys. 39, 630 (1963); see also calculations of ∊1, and ∊2 based on these measurements, R. E. LaVilla and H. Mendlowitz J. Phys. (Paris) 25, 114 (1964).

N. Swanson and C. J. Powell (private communication).

Rabinovitch, K.

K. Rabinovitch, L. R. Canfield, and R. P. Madden, Appl. Opt. 4, 1005 (1965).

Revell, R. S. M.

R. S. M. Revell and A. W. Agar, Brit. J. Appl. Phys. 6, 23 (1955).

Roessler, D. M.

D. M. Roessler and W. C. Walker, J. Phys. Chem Solids 28, 1507 (1967).

Swanson, N.

N. Swanson and C. J. Powell, J. Chem. Phys. 39, 630 (1963); see also calculations of ∊1, and ∊2 based on these measurements, R. E. LaVilla and H. Mendlowitz J. Phys. (Paris) 25, 114 (1964).

N. Swanson and C. J. Powell (private communication).

Tolansky, S.

S. Tolansky, Multiple Beam Interferometry of Surfaces and Films (The Clarendon Press, Oxford, 1948).

Tousey, R.

R. Tousey, J. Opt. Soc. Am. 29, 235 (1939).

Walker, W. C.

D. M. Roessler and W. C. Walker, J. Phys. Chem Solids 28, 1507 (1967).

Other

R. P. Madden in Physics of Thin Films, Vol. I, G. Hass and R. Thun, Eds. (Academic Press Inc., New York, 1963) p. 123.

U. Fano, Ann. Rev. Nucl. Sci. 13, 1 (1963), and references therein.

H. R. Philipp and H. E. Ehrenreich, Phys. Rev. 129, 1550 (1963); H. Raether, Springer Tracts in Mod. Phys. 38, 84 (1965); R. E. LaVilla and H. Mendlowitz, Appl. Opt. 6, 61 (1967).

M. Creuzburg, Z. Physik 196, 433 (1966).

J. G. Carter, T. M. Jelinek, R. N. Hamm, and R. D. Birkhoff, J. Chem. Phys. 44, 2266 (1966).

N. Swanson and C. J. Powell, J. Chem. Phys. 39, 630 (1963); see also calculations of ∊1, and ∊2 based on these measurements, R. E. LaVilla and H. Mendlowitz J. Phys. (Paris) 25, 114 (1964).

K. Rabinovitch, L. R. Canfield, and R. P. Madden, Appl. Opt. 4, 1005 (1965).

R. S. M. Revell and A. W. Agar, Brit. J. Appl. Phys. 6, 23 (1955).

S. Tolansky, Multiple Beam Interferometry of Surfaces and Films (The Clarendon Press, Oxford, 1948).

A convenient form of Fresnel's equations can be found in Ref. 11.

R. Tousey, J. Opt. Soc. Am. 29, 235 (1939).

D. W. Juenker, J. Opt. Soc. Am. 55, 295 (1965).

W. R. Hunter, J. Opt. Soc. Am. 55, 1197 (1965).

N. Swanson and C. J. Powell (private communication).

D. M. Roessler and W. C. Walker, J. Phys. Chem Solids 28, 1507 (1967).

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