Abstract

Lifetimes of the upper states of two optical-resonance transitions in aluminum have been measured using the phase-shift method. Data were taken over a large range of fluorescence intensities, to allow for evaluation of the effects of scattered exciting light and radiation entrapment. The results obtained are τ4s2S12=7.05, τ3d2D = 13.70 ± 0.40 nsec.

© 1968 Optical Society of America

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