Abstract

The index of refraction, n, of sodium films evaporated onto quartz substrates has been determined in the spectral region from 420 to 2000 Å from interference patterns observed in the reflected beam and from the critical angle marking the onset of “total reflection.” The growth of an oxide layer on the surface of a film is shown not to alter appreciably the position of interference maxima and minima. The real part of the dielectric constant was consistent with a nearly-free-electron model. The effective volume–plasmon energy was found to be 5.69±0.06 eV, in agreement with the values determined from electron-energy-loss experiments.

© 1967 Optical Society of America

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