Abstract

The optical constants n and k of evaporated platinum films on glass substrates have been measured in the spectral region 4500Å–7500Å. The reflectance Rm of gold and platinum films on a potassium tantalate (KTaO3) substrate has been measured from the substrate side and found to be somewhat lower than the calculated values. This discrepancy may be explained by relatively small alternations in n and/or k of the metal film or by scatter at the KTaO3–metal interface.

© 1966 Optical Society of America

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References

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  1. O. S. Heavens, “Optical Constants of Thin Films,” in Physics of Thin Films (Academic Press Inc., New York, 1964), Vol. 2, pp. 193–238.
  2. P. R. Phillip, J. Phys. Radium 20, 742 (1959).
    [Crossref]
  3. R. W. Soshea and R. C. Lucas, Phys. Rev. 138, A1182 (1965).
    [Crossref]
  4. S. H. Wemple, Phys. Rev. 137, A1575 (1965).
    [Crossref]
  5. L. G. Schulz, J. Opt. Soc. Am. 44, 357 (1954).
    [Crossref]
  6. G. H. Hass (private communication).
  7. W. Meier, Ann. Physik,  31, 1017 (1910).
    [Crossref]
  8. K. Lauch, Ann. Physik 74, 55 (1923).

1965 (2)

R. W. Soshea and R. C. Lucas, Phys. Rev. 138, A1182 (1965).
[Crossref]

S. H. Wemple, Phys. Rev. 137, A1575 (1965).
[Crossref]

1959 (1)

P. R. Phillip, J. Phys. Radium 20, 742 (1959).
[Crossref]

1954 (1)

1923 (1)

K. Lauch, Ann. Physik 74, 55 (1923).

1910 (1)

W. Meier, Ann. Physik,  31, 1017 (1910).
[Crossref]

Hass, G. H.

G. H. Hass (private communication).

Heavens, O. S.

O. S. Heavens, “Optical Constants of Thin Films,” in Physics of Thin Films (Academic Press Inc., New York, 1964), Vol. 2, pp. 193–238.

Lauch, K.

K. Lauch, Ann. Physik 74, 55 (1923).

Lucas, R. C.

R. W. Soshea and R. C. Lucas, Phys. Rev. 138, A1182 (1965).
[Crossref]

Meier, W.

W. Meier, Ann. Physik,  31, 1017 (1910).
[Crossref]

Phillip, P. R.

P. R. Phillip, J. Phys. Radium 20, 742 (1959).
[Crossref]

Schulz, L. G.

Soshea, R. W.

R. W. Soshea and R. C. Lucas, Phys. Rev. 138, A1182 (1965).
[Crossref]

Wemple, S. H.

S. H. Wemple, Phys. Rev. 137, A1575 (1965).
[Crossref]

Ann. Physik (2)

W. Meier, Ann. Physik,  31, 1017 (1910).
[Crossref]

K. Lauch, Ann. Physik 74, 55 (1923).

J. Opt. Soc. Am. (1)

J. Phys. Radium (1)

P. R. Phillip, J. Phys. Radium 20, 742 (1959).
[Crossref]

Phys. Rev. (2)

R. W. Soshea and R. C. Lucas, Phys. Rev. 138, A1182 (1965).
[Crossref]

S. H. Wemple, Phys. Rev. 137, A1575 (1965).
[Crossref]

Other (2)

G. H. Hass (private communication).

O. S. Heavens, “Optical Constants of Thin Films,” in Physics of Thin Films (Academic Press Inc., New York, 1964), Vol. 2, pp. 193–238.

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Figures (6)

F. 1
F. 1

Refractive index n of KTaO3. Curve based on n2−1=3.66/[1−(1910 Å/λ)2].

F. 2
F. 2

Experimental apparatus for reflectance measurements.

F. 3
F. 3

Dependence of optical constant n of evaporated platinum film on wavelength.

F. 4
F. 4

Dependence of optical constant k of evaporated platinum film on wavelength.

F. 5
F. 5

Dependence of reflectance Rmetal of KTaO3–gold interface on wavelength. Experimental values, ●; calculated values, ○.

F. 6
F. 6

Dependence of reflectance Rmetal of KTaO3–platinum interface on wavelength. Uncertainty in the calculated values is due to the uncertainties in n and k shown in Figs. 3 and 4. Experimental values ●; calculated values, ○.

Equations (4)

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R = R K T + R m ( 1 R K T ) 2 / ( 1 R m R K T ) ,
R m = ( R R K T ) / [ 1 + R K T ( R 2 ) ] .
R m s R m p R m = [ ( n K T n ) 2 + k 2 ] / [ ( n K T + n ) 2 + k 2 ] .
n K T = 1 / T + ( 1 / T 2 1 ) 1 2 .