Abstract

Total-reflectance measurements on a number of igneous rocks and other minerals indicate that reststrahlen features may be of use for remote probes into the nature of the surfaces of the moon and planets. Varying particle size introduces effects such as reduced spectral contrast and in some cases new features that could lead to confusion in identification unless particle size is known. Short-wavelength reflectance measurements offer a method of determining particle size by remote measurements.

© 1966 Optical Society of America

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References

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  1. J. U. White, J. Opt. Soc. Am. 54, 1332 (1964).
    [Crossref]
  2. R. J. P. Lyon, Econ. Geol. 60, 715 (1965).
    [Crossref]

1965 (1)

R. J. P. Lyon, Econ. Geol. 60, 715 (1965).
[Crossref]

1964 (1)

Lyon, R. J. P.

R. J. P. Lyon, Econ. Geol. 60, 715 (1965).
[Crossref]

White, J. U.

Econ. Geol. (1)

R. J. P. Lyon, Econ. Geol. 60, 715 (1965).
[Crossref]

J. Opt. Soc. Am. (1)

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Figures (16)

Fig. 1
Fig. 1

North American Aviation standard granite.

Fig. 2
Fig. 2

North American Aviation standard Oregon serpentine.

Fig. 3
Fig. 3

North American Aviation standard Oregon basalt.

Fig. 4
Fig. 4

Dunite—Merenfelder Moar (Germany).

Fig. 5
Fig. 5

Tektite (S. E. Asia).

Fig. 6
Fig. 6

Yellowstone Tuff #62-13.

Fig. 7
Fig. 7

Yellowstone Tuff #6.

Fig. 8
Fig. 8

Red sandstone.

Fig. 9
Fig. 9

Igneous rocks—solid samples.

Fig. 10
Fig. 10

Igneous rocks—1–2-mm samples.

Fig. 11
Fig. 11

Igneous rocks—0.105–0.250-mm samples.

Fig. 12
Fig. 12

Igneous rocks—less than 0.038-mm samples.

Fig. 13
Fig. 13

Igneous rocks—mixed samples.

Fig. 14
Fig. 14

7–15 μ region for various materials. (—) solid sample, (— · —)0.105–0.25 mm, (· · · ·)<0.038 mm, (– – – –)≪0.038 mm.

Fig. 15
Fig. 15

General Electric 106 fused quartz.

Fig. 16
Fig. 16

Dynasil quartz.

Tables (1)

Tables Icon

Table I Analysis of the samples used.