P. Drude, Ann. Physik 272, 532 (1890).
A. B. Winterbottom, Optical Studies of Metal Surfaces, The Royal Norwegian Scientific Society, Report No. 1 (F. Bruns, Trondheim, Norway, 1955).
F. L. McCrackin, E. Passaglia, R. R. Stromberg, and H. L. Steinberg, J. Res. Natl. Bur. Std. 67A, 363 (1963).
E. Passaglia, R. R. Stromberg, and J. Kruger, Eds., Ellipsometry in the Measurement of Surfaces and Thin Films. Symposium Proceedings. NBS Misc. Publ. No. 256 (U. S. Govt. Printing Office, Wash. D. C., 1964).
The program used for the calculations in this paper is given by F. L. McCrackin and J. Colson, NBS Tech. Note 242 (1964).
W. Meier, Ann. Physik 31, 1017 (1910).
C. A. Reeser, Arch. Néerland 6, 225 (1923).
J. Ellerbroek, Arch Néerland 10, 42 (1927).
L. Tronstad and C. G. P. Feachem, Proc. Roy. Soc. (London) A145, 115 (1934).
R. M. Emberson, J. Opt. Soc. Am. 26, 443 (1936).
L. G. Schulz, J. Opt. Soc. Am. 47, 64 (1957).
L. G. Lelyuk, I. N. Shklyarevskii, and R. G. Yarovaya, Opt. i Spektroskopiya 16, 484 (1964); Translation-Opt. Spectry. 16, 263 (1964).
J. N. Hodgson, Phil. Mag. 4, 183 (1959).
Width of transmission band at half height was reported to be 4.0 Å; purchased from Thin Film Products, Cambridge, Mass. In all cases, reference to a company or product is made to specify experimental details and does not imply approval or recommendation of the product by the National Bureau of Standards.
Note that this expression for the complex refractive index has been changed from that used in Ref. 3 since it has been found to permit a more direct interpretation of the effects of the various errors.
International Critical Tables of Numerical Data (McGraw-Hill Book Co., Inc.. New York. 1926–30), Vol. V, p. 249.
D. K. Burge and H. E. Bennett, J. Opt. Soc. Am. 54, 1428 (1964).
For a short discussion of strain-tree optical materials see Primak in Ref. 4, p. 154