Abstract

A description is given of a computer program for analyzing reflectance data from an absorbing medium in terms of the complex refractive index. The procedure is an adaptation of Tousey’s graphical method of locating the intersection of two or more curves of constant reflectance in the nk plane. It is also an extension of that method, in that it can be applied to thin films as well as to bulk specimens. In the case of films, information additional to the reflectance data must be used to choose from among multiple intersections of the isoreflectance curves. A method for plotting the isoreflectors is suggested.

© 1965 Optical Society of America

Errors in using the Reflectance vs Angle of Incidence Method for Measuring Optical Constants*

W. R. Hunter
J. Opt. Soc. Am. 55(10) 1197-1204 (1965)

Reflectance and Optical Constants of Evaporated Copper and Silver in the Vacuum Ultraviolet from 1000 to 2000 Å*

L. R. Canfield and G. Hass
J. Opt. Soc. Am. 55(1) 61-64 (1965)

Uncertainties in the Optical Constants Determined from Isoreflectance Curves

Amos Engelsrath and Ernest V. Loewenstein
Appl. Opt. 5(4) 565-567 (1966)

Changes in the Phase and Amplitude of Polarized Light Reflected from a Film-Covered Surface and Their Relations with the Film Thickness

A. N. Saxena
J. Opt. Soc. Am. 55(9) 1061-1067 (1965)

Interspecimen Comparison of the Refractive Index of Fused Silica*,†

I. H. Malitson
J. Opt. Soc. Am. 55(10) 1205-1209 (1965)