The index of refraction of optical quality fused silica (SiO2) was determined for 60 wavelengths from 0.21 to 3.71 μ at 20°C. The dispersion equation
where λ is expressed in microns was found to yield an absolute residual of 10.5×10−6. The variation in index between 12 specimens was determined. Dispersive properties of the material and thermal coefficient of index are graphically presented. A comparison with previous NBS index data is discussed.
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