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  1. P. Drude, The Theory of Optics (Dover Publications, Inc., New York, (1959).
  2. H. Mayer, Physik dünner Schichten (Wissenschaftliche Verlagsgesellschaft MBH, Stuttgart, 1950), p. 53.
  3. O. S. Heavens, Optical Properties of Thin Solid Films (Academic Press Inc., New York, 1955), p. 103.
  4. H. Wolter, “Optik. dünner Schichten,” in Encyclopedia of Physics, edited by S. Flügge (Springer-Verlag, Berlin, 1956), Vol. 24, p. 528.
  5. S. Tolansky, An Introduction to Interferometry (Longmans Green and Company, Ltd., London, 1955), p. 39.
  6. S. Tolansky, Multiple-Beam Interferometry (Clarendon Press, Oxford, 1949), p. 40.
  7. The sign convention employed in recent texts such as Stone,8 Françon,9 Valasek,10 and Rossi11 is used here.
  8. J. M. Stone, Radiation and Optics (McGraw-Hill Book Company, Inc., New York, 1963), p. 397.
  9. M. Françon, “Interférence, diffraction et polarisation,” in Encyclopedia of Physics, edited by S. Flügge (Springer-Verlag, Berlin, 1956), Vol. 24, p. 391.
  10. I. Valasek, Introduction to Theoretical and Experimental Optics (John Wiley & Sons, Inc., New York, 1949), p. 199.
  11. B. Rossi, Optics (Addison-Wesley Publishing Company, Inc., Reading Massachusetts, 1959), p. 373.
  12. W. König, “Elektromagnetische Lichttheorie,” in Handbuch der Physik, edited by H. Geiger and K. Scheel (Julius Springer, Berlin, 1928), Vol. 20, p. 242.
  13. W. Voigt, Nachr. Ges. Wiss. Göttingen Math.-Physik. Kl.1902,  259.

1902 (1)

W. Voigt, Nachr. Ges. Wiss. Göttingen Math.-Physik. Kl.1902,  259.

Drude, P.

P. Drude, The Theory of Optics (Dover Publications, Inc., New York, (1959).

Françon, M.

M. Françon, “Interférence, diffraction et polarisation,” in Encyclopedia of Physics, edited by S. Flügge (Springer-Verlag, Berlin, 1956), Vol. 24, p. 391.

Heavens, O. S.

O. S. Heavens, Optical Properties of Thin Solid Films (Academic Press Inc., New York, 1955), p. 103.

König, W.

W. König, “Elektromagnetische Lichttheorie,” in Handbuch der Physik, edited by H. Geiger and K. Scheel (Julius Springer, Berlin, 1928), Vol. 20, p. 242.

Mayer, H.

H. Mayer, Physik dünner Schichten (Wissenschaftliche Verlagsgesellschaft MBH, Stuttgart, 1950), p. 53.

Rossi, B.

B. Rossi, Optics (Addison-Wesley Publishing Company, Inc., Reading Massachusetts, 1959), p. 373.

Stone, J. M.

J. M. Stone, Radiation and Optics (McGraw-Hill Book Company, Inc., New York, 1963), p. 397.

Tolansky, S.

S. Tolansky, An Introduction to Interferometry (Longmans Green and Company, Ltd., London, 1955), p. 39.

S. Tolansky, Multiple-Beam Interferometry (Clarendon Press, Oxford, 1949), p. 40.

Valasek, I.

I. Valasek, Introduction to Theoretical and Experimental Optics (John Wiley & Sons, Inc., New York, 1949), p. 199.

Voigt, W.

W. Voigt, Nachr. Ges. Wiss. Göttingen Math.-Physik. Kl.1902,  259.

Wolter, H.

H. Wolter, “Optik. dünner Schichten,” in Encyclopedia of Physics, edited by S. Flügge (Springer-Verlag, Berlin, 1956), Vol. 24, p. 528.

Nachr. Ges. Wiss. Göttingen Math.-Physik. Kl. (1)

W. Voigt, Nachr. Ges. Wiss. Göttingen Math.-Physik. Kl.1902,  259.

Other (12)

P. Drude, The Theory of Optics (Dover Publications, Inc., New York, (1959).

H. Mayer, Physik dünner Schichten (Wissenschaftliche Verlagsgesellschaft MBH, Stuttgart, 1950), p. 53.

O. S. Heavens, Optical Properties of Thin Solid Films (Academic Press Inc., New York, 1955), p. 103.

H. Wolter, “Optik. dünner Schichten,” in Encyclopedia of Physics, edited by S. Flügge (Springer-Verlag, Berlin, 1956), Vol. 24, p. 528.

S. Tolansky, An Introduction to Interferometry (Longmans Green and Company, Ltd., London, 1955), p. 39.

S. Tolansky, Multiple-Beam Interferometry (Clarendon Press, Oxford, 1949), p. 40.

The sign convention employed in recent texts such as Stone,8 Françon,9 Valasek,10 and Rossi11 is used here.

J. M. Stone, Radiation and Optics (McGraw-Hill Book Company, Inc., New York, 1963), p. 397.

M. Françon, “Interférence, diffraction et polarisation,” in Encyclopedia of Physics, edited by S. Flügge (Springer-Verlag, Berlin, 1956), Vol. 24, p. 391.

I. Valasek, Introduction to Theoretical and Experimental Optics (John Wiley & Sons, Inc., New York, 1949), p. 199.

B. Rossi, Optics (Addison-Wesley Publishing Company, Inc., Reading Massachusetts, 1959), p. 373.

W. König, “Elektromagnetische Lichttheorie,” in Handbuch der Physik, edited by H. Geiger and K. Scheel (Julius Springer, Berlin, 1928), Vol. 20, p. 242.

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Figures (3)

Fig. 1
Fig. 1

Reflections from a transparent film on a metal surface, designation of amplitudes and angles.

Fig. 2
Fig. 2

Phase relationship of incident and reflected light (a) for destructive interference with vanishing film thickness, (b) for constructive interference with vanishing film thickness, (c) for destructive interference with λ/2 path in the film.

Fig. 3
Fig. 3

Amplitude ratio of interfering waves reflected by a transparent thin film (n1=1.365) on different metal surfaces.

Tables (2)

Tables Icon

Table I Optical constants of metals for sodium light (λ=0.589 μ).

Tables Icon

Table II Optimum angles of incidence ϕ and ϕ|| for the observation of transparent thin films on different metal surfaces with Na light polarized normal (⊥) and parallel (||) to the plane of incidence.

Equations (3)

Equations on this page are rendered with MathJax. Learn more.

n = n 2 ( 1 - i κ 2 ) ,
1 R n E = D 0 E R 1 M 1 M 1 D 0 / ( 1 - D 1 M 1 M 1 D 0 ) .
R 0 E / 1 R n E .