Abstract

An accurate but simple reflectometer is described for measuring the spectral reflectances at normal incidence of flat, specularly reflecting surfaces. The instrument has a wavelength range of 0.2–2.5 μm and, with transparent samples, provides for simultaneous measurement of spectral transmittances.

© 1964 Optical Society of America

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References

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  1. P. Rouard, Compt. Rend. 195, 869 (1932).
  2. G. E. Pride, J. Opt. Soc. Am. 36, 510 (1946).
    [Crossref] [PubMed]
  3. J. Terrien, Rev. Opt. 23, 105 (1944).
  4. H. Kuhn and B. A. Wilson, Proc. Phys. Soc. (London) B63, 745 (1950).
  5. R. F. Weeks, J. Opt. Soc. Am. 48, 775 (1958).
    [Crossref]
  6. J. Strong, Proceedings in Experimental Physics (Prentice-Hall, Inc., Englewood Cliffs, New Jersey, 1942), p. 376.
  7. D. M. Gates, C. S. Shaw, and D. Beaumont, J. Opt. Soc. Am. 48, 88 (1958).
    [Crossref]
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    [Crossref]
  9. J. T. Gier, R. V. Dunkle, and J. T. Bevans, J. Opt. Soc. Am. 44, 558 (1954).
    [Crossref]
  10. C. D. Reid and E. D. McAlister, J. Opt. Soc. Am. 49, 78 (1959).
    [Crossref]
  11. J. T. Agnew and R. B. McQuistan, J. Opt. Soc. Am. 43, 999 (1953).
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  12. H. E. Bennett, J. M. Bennett, and E. J. Ashley, J. Opt. Soc. Am. 52, 1245 (1962).
    [Crossref]

1962 (1)

1960 (1)

1959 (1)

1958 (2)

1954 (1)

1953 (1)

1950 (1)

H. Kuhn and B. A. Wilson, Proc. Phys. Soc. (London) B63, 745 (1950).

1946 (1)

1944 (1)

J. Terrien, Rev. Opt. 23, 105 (1944).

1932 (1)

P. Rouard, Compt. Rend. 195, 869 (1932).

Agnew, J. T.

Ashley, E. J.

Beaumont, D.

Bennett, H. E.

Bennett, J. M.

Bevans, J. T.

Dunkle, R. V.

Gates, D. M.

Gier, J. T.

Koehler, W. F.

Kuhn, H.

H. Kuhn and B. A. Wilson, Proc. Phys. Soc. (London) B63, 745 (1950).

McAlister, E. D.

McQuistan, R. B.

Pride, G. E.

Reid, C. D.

Rouard, P.

P. Rouard, Compt. Rend. 195, 869 (1932).

Shaw, C. S.

Strong, J.

J. Strong, Proceedings in Experimental Physics (Prentice-Hall, Inc., Englewood Cliffs, New Jersey, 1942), p. 376.

Terrien, J.

J. Terrien, Rev. Opt. 23, 105 (1944).

Weeks, R. F.

Wilson, B. A.

H. Kuhn and B. A. Wilson, Proc. Phys. Soc. (London) B63, 745 (1950).

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Figures (1)

Fig. 1
Fig. 1

Schematic diagram of the reflectometer. S, exit slit of monochromator; M1, M3, plane mirrors; M2, spherical mirror; P1, P2, silica plates; A1, A2, apertures; X, sample; Sh1, Sh2, shutters; D, diffuser; C, photocell.

Tables (1)

Tables Icon

Table I Comparison of spectral reflectance values for aged films of evaporated aluminum.

Equations (3)

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F R = R r 1 ,
F T = T r 2 .
F I = r 2 .