Abstract

A new exact method of extracting optical constants from reflectance ratios obtained by the Avery technique is presented. The method yields the real and imaginary parts of the complex dielectric constant directly by means of a simple geometric construction. The method is illustrated by a practical case taken from measurements on gray tin.

© 1963 Optical Society of America

Evaluation of the One-Angle Reflection Technique for the Determination of Optical Constants

H. J. Bowlden and J. K. Wilmshurst
J. Opt. Soc. Am. 53(9) 1073-1078 (1963)

On Calculating the Optical Constants from Reflection Coefficients

Richard Tousey
J. Opt. Soc. Am. 29(6) 235-239 (1939)

Some New Formulas for Determining the Optical Constants from Measurements on Reflected Light

R. W. Ditchburn
J. Opt. Soc. Am. 45(9) 743-748 (1955)

Some Observations on the Use of Elliptically Polarized Light to Study Metal Surfaces*

Frederick P. Mertens, Paul Theroux, and Robert C. Plumb
J. Opt. Soc. Am. 53(7) 788-796 (1963)

On the Variation with Wavelength of the Optical Constants of Thin Metallic Films

G. Rasigni and P. Rouard
J. Opt. Soc. Am. 53(5) 604-612 (1963)