Abstract

A special type of double-layer antireflection coating for infrared optical materials is described. This coating has two unusual features: the total optical thickness of the double layer is less than one-quarter wavelength; and the film with the higher index of refraction is on the outside. The reduction in reflectance in the low reflecting region is similar to that of a single-layer coating. Measured values of transmittance are given for coatings on Si and Ge. An interesting point in one of the examples is the use of a Ge film in the antireflection coating for Ge. The coatings are very durable.

© 1961 Optical Society of America

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References

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  1. K. Schuster, Ann. Phys. 4, 352 (1949).
    [Crossref]
  2. J. T. Cox, G. Hass, and R. F. Rowntree, Vacuum IV, 445 (1954).
    [Crossref]
  3. J. T. Cox, G. Hass, and G. F. Jacobus, J. Opt. Soc. Am. 51, 714 (1961).
    [Crossref]

1961 (1)

1954 (1)

J. T. Cox, G. Hass, and R. F. Rowntree, Vacuum IV, 445 (1954).
[Crossref]

1949 (1)

K. Schuster, Ann. Phys. 4, 352 (1949).
[Crossref]

Cox, J. T.

J. T. Cox, G. Hass, and G. F. Jacobus, J. Opt. Soc. Am. 51, 714 (1961).
[Crossref]

J. T. Cox, G. Hass, and R. F. Rowntree, Vacuum IV, 445 (1954).
[Crossref]

Hass, G.

J. T. Cox, G. Hass, and G. F. Jacobus, J. Opt. Soc. Am. 51, 714 (1961).
[Crossref]

J. T. Cox, G. Hass, and R. F. Rowntree, Vacuum IV, 445 (1954).
[Crossref]

Jacobus, G. F.

Rowntree, R. F.

J. T. Cox, G. Hass, and R. F. Rowntree, Vacuum IV, 445 (1954).
[Crossref]

Schuster, K.

K. Schuster, Ann. Phys. 4, 352 (1949).
[Crossref]

Ann. Phys. (1)

K. Schuster, Ann. Phys. 4, 352 (1949).
[Crossref]

J. Opt. Soc. Am. (1)

Vacuum (1)

J. T. Cox, G. Hass, and R. F. Rowntree, Vacuum IV, 445 (1954).
[Crossref]

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Figures (5)

Fig. 1
Fig. 1

Regions (shaded) in which zero reflectance is possible for a double-layer antireflection coating (ns=3.5).

Fig. 2
Fig. 2

Layer thicknesses in quarter-wavelengths, for a double-layer coating which produces zero reflectance, plotted as a function of the index of the outer layer n1 with n2=1.35 and ns=3.5.

Fig. 3
Fig. 3

Transmittance of a silicon plate with antireflection coatings of MgF2 (nt=λ/4 at 0.84 μ)+ZnS (nt=λ/4 at 1.5 μ).

Fig. 4
Fig. 4

Transmittance of a silicon plate with antireflection coatings of MgF2 (nt=λ/4 at 3 μ)+ZnS (nt=λ/4 at 6 μ).

Fig. 5
Fig. 5

Transmittance of a germanium plate with antireflection coatings of MgF2 (nt=λ/4 at 1.03 μ)+Ge (nt=λ/4 at 0.61 μ).

Equations (2)

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tan 2 θ 1 = ( 1 - 1 / n s ) ( n 2 / n s - 1 / n 2 ) ( n 1 / n 2 - n 2 / n 1 n s ) ( 1 / n 1 - n 1 / n s )
tan 2 θ 2 = ( 1 - 1 / n s ) ( 1 / n 1 - n 1 / n s ) ( n 1 / n 2 - n 2 / n 1 n s ) ( n 2 / n s - 1 / n 2 )