Abstract

The reflectivity and transmissivity of Sb, Te, and Ti films have been measured in the range from 1600 to 450 A in order to compare the frequency at which the films change from a reflecting to a transmitting medium with the plasma frequency predicted by Bohm and Pines and also with electron energy characteristic losses in metals observed by Marton et al. and by Powell.

© 1961 Optical Society of America

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References

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  1. F. Seitz, Modern Theory of Solids (McGraw-Hill Book Company, Inc., New York, 1940), Chaps. IV, XVII.
  2. M. Parker Givens, Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press Inc., 1958), Vol. 6, p.313.
    [Crossref]
  3. L. G. Schulz, Phil. Mag. Suppl. 6, 102 (1957).
  4. W. C. Walker, O. P. Rustgi, and G. L. Weissler, J. Opt. Soc. Am. 49, 471 (1959).
    [Crossref]
  5. N. N. Axelrod and M. Parker Givens, Phys. Rev. 120, 1205 (1960).
    [Crossref]
  6. D. Pines, Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press, Inc., New York, 1955), Vol. 1, p. 367.
    [Crossref]
  7. D. Pines, Revs. Modern Phys. 28, 184 (1956).
    [Crossref]
  8. S. Tolansky, Multiple Beam Interferometry of Surfaces and Films (Clarendon Press, Oxford, England, 1948).
  9. L. Marton, L. B. Leder, and H. Mendlowitz, Advances in Electronics and Electron Physics, edited by L. Marton (Academic Press Inc., New York, 1955), Vol. 7, p. 211.
  10. C. J. Powell, Proc. Phys. Soc. (London) 76, 593 (1960).
    [Crossref]
  11. H. Mendlowitz, J. Opt. Soc. Am. 50, 739 (1960).
    [Crossref]
  12. H. Fröhlich and H. Pelzer, Proc. Phys. Soc. (London) A68, 525 (1955).
  13. O. P. Rustgi, J. Nodvik, and G. L. Weissler, Phys. Rev. (to be published).

1960 (3)

N. N. Axelrod and M. Parker Givens, Phys. Rev. 120, 1205 (1960).
[Crossref]

C. J. Powell, Proc. Phys. Soc. (London) 76, 593 (1960).
[Crossref]

H. Mendlowitz, J. Opt. Soc. Am. 50, 739 (1960).
[Crossref]

1959 (1)

1957 (1)

L. G. Schulz, Phil. Mag. Suppl. 6, 102 (1957).

1956 (1)

D. Pines, Revs. Modern Phys. 28, 184 (1956).
[Crossref]

1955 (1)

H. Fröhlich and H. Pelzer, Proc. Phys. Soc. (London) A68, 525 (1955).

Axelrod, N. N.

N. N. Axelrod and M. Parker Givens, Phys. Rev. 120, 1205 (1960).
[Crossref]

Fröhlich, H.

H. Fröhlich and H. Pelzer, Proc. Phys. Soc. (London) A68, 525 (1955).

Leder, L. B.

L. Marton, L. B. Leder, and H. Mendlowitz, Advances in Electronics and Electron Physics, edited by L. Marton (Academic Press Inc., New York, 1955), Vol. 7, p. 211.

Marton, L.

L. Marton, L. B. Leder, and H. Mendlowitz, Advances in Electronics and Electron Physics, edited by L. Marton (Academic Press Inc., New York, 1955), Vol. 7, p. 211.

Mendlowitz, H.

H. Mendlowitz, J. Opt. Soc. Am. 50, 739 (1960).
[Crossref]

L. Marton, L. B. Leder, and H. Mendlowitz, Advances in Electronics and Electron Physics, edited by L. Marton (Academic Press Inc., New York, 1955), Vol. 7, p. 211.

Nodvik, J.

O. P. Rustgi, J. Nodvik, and G. L. Weissler, Phys. Rev. (to be published).

Parker Givens, M.

N. N. Axelrod and M. Parker Givens, Phys. Rev. 120, 1205 (1960).
[Crossref]

M. Parker Givens, Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press Inc., 1958), Vol. 6, p.313.
[Crossref]

Pelzer, H.

H. Fröhlich and H. Pelzer, Proc. Phys. Soc. (London) A68, 525 (1955).

Pines, D.

D. Pines, Revs. Modern Phys. 28, 184 (1956).
[Crossref]

D. Pines, Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press, Inc., New York, 1955), Vol. 1, p. 367.
[Crossref]

Powell, C. J.

C. J. Powell, Proc. Phys. Soc. (London) 76, 593 (1960).
[Crossref]

Rustgi, O. P.

W. C. Walker, O. P. Rustgi, and G. L. Weissler, J. Opt. Soc. Am. 49, 471 (1959).
[Crossref]

O. P. Rustgi, J. Nodvik, and G. L. Weissler, Phys. Rev. (to be published).

Schulz, L. G.

L. G. Schulz, Phil. Mag. Suppl. 6, 102 (1957).

Seitz, F.

F. Seitz, Modern Theory of Solids (McGraw-Hill Book Company, Inc., New York, 1940), Chaps. IV, XVII.

Tolansky, S.

S. Tolansky, Multiple Beam Interferometry of Surfaces and Films (Clarendon Press, Oxford, England, 1948).

Walker, W. C.

Weissler, G. L.

W. C. Walker, O. P. Rustgi, and G. L. Weissler, J. Opt. Soc. Am. 49, 471 (1959).
[Crossref]

O. P. Rustgi, J. Nodvik, and G. L. Weissler, Phys. Rev. (to be published).

J. Opt. Soc. Am. (2)

Phil. Mag. Suppl. (1)

L. G. Schulz, Phil. Mag. Suppl. 6, 102 (1957).

Phys. Rev. (1)

N. N. Axelrod and M. Parker Givens, Phys. Rev. 120, 1205 (1960).
[Crossref]

Proc. Phys. Soc. (London) (2)

C. J. Powell, Proc. Phys. Soc. (London) 76, 593 (1960).
[Crossref]

H. Fröhlich and H. Pelzer, Proc. Phys. Soc. (London) A68, 525 (1955).

Revs. Modern Phys. (1)

D. Pines, Revs. Modern Phys. 28, 184 (1956).
[Crossref]

Other (6)

S. Tolansky, Multiple Beam Interferometry of Surfaces and Films (Clarendon Press, Oxford, England, 1948).

L. Marton, L. B. Leder, and H. Mendlowitz, Advances in Electronics and Electron Physics, edited by L. Marton (Academic Press Inc., New York, 1955), Vol. 7, p. 211.

D. Pines, Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press, Inc., New York, 1955), Vol. 1, p. 367.
[Crossref]

F. Seitz, Modern Theory of Solids (McGraw-Hill Book Company, Inc., New York, 1940), Chaps. IV, XVII.

M. Parker Givens, Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press Inc., 1958), Vol. 6, p.313.
[Crossref]

O. P. Rustgi, J. Nodvik, and G. L. Weissler, Phys. Rev. (to be published).

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Figures (3)

Fig. 1
Fig. 1

Measurements on Sb films. △, reflectivity from a glass-backed film, 860 A thick, evaporated in situ. □, transmissivity from a stilbene-backed film, 1330 A thick, evaporated outside the monochromator. Arrow down denotes the theoretical plasma frequency and arrow up the onset of optical transmission. Vertical lines marked e denote the positions of the known characteristic electron-energy losses.

Fig. 2
Fig. 2

Measurements on Te films. △, reflectivity from a glass-backed film, 400 A thick, evaporated in situ. □, transmissivity from a stilbene-backed film, 930 A thick, evaporated outside the monochromator. Arrow down denotes the theoretical plasma frequency. Vertical line marked e denotes the position of the known characteristic electron-energy losses.

Fig. 3
Fig. 3

Measurements on Ti films. Δ, reflectivity from a glass-backed film, 324 A thick, and □, transmissivity from an unbacked film, 1020 A thick, both evaporated outside the monochromator. Arrow down denotes the theoretical plasma frequency and arrow up the onset of optical transmission. Vertical line marked e denotes the position of the known characteristic electron energy losses.

Tables (1)

Tables Icon

Table I A comparison of p with the optical data and the observed electron energy characteristic losses for various solids. All energies are given in ev. References are shown either by superscript reference numbers or superscript letter.