Abstract

A newly designed device for the measurement of absolute reflectance in the vacuum ultraviolet region is discussed. Notable features of this reflectometer are compactness and simplicity. The source and monochromator with which the reflectometer is used are also discussed. The system produces data in the wavelength range 800 to 2500 A at any angle of incidence between 15° and 80°. A sample reflectance curve for a crystal of KCl is shown.

© 1960 Optical Society of America

Reflectance-Increasing Coatings for the Vacuum Ultraviolet and Their Applications*

P. H. Berning, G. Hass, and R. P. Madden
J. Opt. Soc. Am. 50(6) 586-597 (1960)

Refractive Dispersion of Nitrogen in the Vacuum Ultraviolet*

P. G. Wilkinson
J. Opt. Soc. Am. 50(10) 1002-1005 (1960)

Scanning Ultrahigh Vacuum Reflectometer

T. Huen, G. B. Irani, and F. Wooten
Appl. Opt. 10(3) 552-556 (1971)

Intensity Measurements in the Vacuum Ultraviolet

K. Watanabe and Edward C. Y. Inn
J. Opt. Soc. Am. 43(1) 32-35 (1953)

Spectrophotometric Attachment for the Vacuum Ultraviolet

Norman N. Axelrod
J. Opt. Soc. Am. 51(8) 898-900 (1961)