Abstract

Interference microscopy has proved useful for the detection and measurement of path differences between an object and its surround. For objects which absorb a fraction of the incident light an additional valuable measurement is the transmittance. Modifications of the AO Baker interference microscope which permit its use as a double-beam microphotometer are described. In some of the systems it is possible to make simultaneous readings of transmittance and optical path. Both visual and photoelectric detection are possible, and in most of the systems light of a finite range of wavelengths may be used.

© 1960 Optical Society of America

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