Abstract

The variable phase system described is characterized by a wide separation of the deviated and the undeviated light bundles so that phase-modifying or absorbing elements can readily be inserted. The path separation is accomplished by a partially aluminized plate inserted in a direction normal to the optical axis, thus facilitating the necessary alignment. Geometrical coincidence has been obtained by introducing into one of the pathways a penta-type mirror system.

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  1. Bennett, Jupnik, Osterberg, and Richards, Trans. Am. Microscop. Soc. 65, 99 (1946).
  2. E. W. Taylor, Proc. Roy. Soc. (London) A190, 422 (1947); H. Heine, U. S. Patent 2,722,863 (1955); W. G. Hartley, Nature 159, 880 (1947); B. O. Payne, J. Roy. Microscop. Soc. III, 74, 108 (1954); H. Osterberg, J. Opt. Soc. Am. 37, 726 (1947); H. Osterberg and A. H. Bennett, U. S. Patent 2,516,905 (1950); 2,700,918 (1955); H. Wolter, "Schlieren-, Phasenkontrast- und Lichtschnittverfahren," in Encyclopedia of Physics, edited by S. Flügge (Springer-Verlag, Berlin, Göttingen, Heidelberg, 1956), Vol. 24, pps. 628–629.
  3. C. Dufour and M. Locquin, Compt. rend. 232, 2087 (1951); M. Locquin and M. Bessis, Rev. opt. 237 (1952); M. V. Locquin, U. S. Patent 2,687,670 (1954); K. Antenen, Mikroskopie 11, 129 (1956); Schweiz. Brau. Rundschau 4 (1956).
  4. A. H. Bennett and A. J. Kavanagh, U. S. Patent 2,737,084 (1956); H. Osterberg, U. S. Patent 2,732,759 (1956); A. H. Bennett, U. S. Patent 2,675,737 (1954); L. Leitz, U. S. Patent 2,746,348 (1956).
  5. A. H. Bennett, U. S. Patent 2,655,077 (1953); A. J. Kavanagh, U. S. Patent 2,685,228 (1954); K. Rantsch, U. S. Patent 2,699,092 (1955); D. Gabor, U. S. Patent 2,770,166 (1956).
  6. H. Heine, U. S. Patent 2,674,157 (1954).
  7. Saylor, Brice, and Zernike, J. Opt. Soc. Am. 40, 329 (1950); F. C. Grigg, Nature 165, 368 (1950).
  8. J. Rheinberg, J. Roy. Microscop. Soc. 16, 373 (1896); H. Wolter, Ann. Physik 8, 1 (1950); F. Gabler, Mikroskopie 6, 98 (1951); M. Bayer and J. Meyer-Arendt, Phot. u. Wiss. 4, 19 (1955).

Bennett, A. H.

A. H. Bennett and A. J. Kavanagh, U. S. Patent 2,737,084 (1956); H. Osterberg, U. S. Patent 2,732,759 (1956); A. H. Bennett, U. S. Patent 2,675,737 (1954); L. Leitz, U. S. Patent 2,746,348 (1956).

A. H. Bennett, U. S. Patent 2,655,077 (1953); A. J. Kavanagh, U. S. Patent 2,685,228 (1954); K. Rantsch, U. S. Patent 2,699,092 (1955); D. Gabor, U. S. Patent 2,770,166 (1956).

Dufour, C.

C. Dufour and M. Locquin, Compt. rend. 232, 2087 (1951); M. Locquin and M. Bessis, Rev. opt. 237 (1952); M. V. Locquin, U. S. Patent 2,687,670 (1954); K. Antenen, Mikroskopie 11, 129 (1956); Schweiz. Brau. Rundschau 4 (1956).

Heine, H.

H. Heine, U. S. Patent 2,674,157 (1954).

Kavanagh, A. J.

A. H. Bennett and A. J. Kavanagh, U. S. Patent 2,737,084 (1956); H. Osterberg, U. S. Patent 2,732,759 (1956); A. H. Bennett, U. S. Patent 2,675,737 (1954); L. Leitz, U. S. Patent 2,746,348 (1956).

Locquin, M.

C. Dufour and M. Locquin, Compt. rend. 232, 2087 (1951); M. Locquin and M. Bessis, Rev. opt. 237 (1952); M. V. Locquin, U. S. Patent 2,687,670 (1954); K. Antenen, Mikroskopie 11, 129 (1956); Schweiz. Brau. Rundschau 4 (1956).

Rheinberg, J.

J. Rheinberg, J. Roy. Microscop. Soc. 16, 373 (1896); H. Wolter, Ann. Physik 8, 1 (1950); F. Gabler, Mikroskopie 6, 98 (1951); M. Bayer and J. Meyer-Arendt, Phot. u. Wiss. 4, 19 (1955).

Taylor, E. W.

E. W. Taylor, Proc. Roy. Soc. (London) A190, 422 (1947); H. Heine, U. S. Patent 2,722,863 (1955); W. G. Hartley, Nature 159, 880 (1947); B. O. Payne, J. Roy. Microscop. Soc. III, 74, 108 (1954); H. Osterberg, J. Opt. Soc. Am. 37, 726 (1947); H. Osterberg and A. H. Bennett, U. S. Patent 2,516,905 (1950); 2,700,918 (1955); H. Wolter, "Schlieren-, Phasenkontrast- und Lichtschnittverfahren," in Encyclopedia of Physics, edited by S. Flügge (Springer-Verlag, Berlin, Göttingen, Heidelberg, 1956), Vol. 24, pps. 628–629.

Other (8)

Bennett, Jupnik, Osterberg, and Richards, Trans. Am. Microscop. Soc. 65, 99 (1946).

E. W. Taylor, Proc. Roy. Soc. (London) A190, 422 (1947); H. Heine, U. S. Patent 2,722,863 (1955); W. G. Hartley, Nature 159, 880 (1947); B. O. Payne, J. Roy. Microscop. Soc. III, 74, 108 (1954); H. Osterberg, J. Opt. Soc. Am. 37, 726 (1947); H. Osterberg and A. H. Bennett, U. S. Patent 2,516,905 (1950); 2,700,918 (1955); H. Wolter, "Schlieren-, Phasenkontrast- und Lichtschnittverfahren," in Encyclopedia of Physics, edited by S. Flügge (Springer-Verlag, Berlin, Göttingen, Heidelberg, 1956), Vol. 24, pps. 628–629.

C. Dufour and M. Locquin, Compt. rend. 232, 2087 (1951); M. Locquin and M. Bessis, Rev. opt. 237 (1952); M. V. Locquin, U. S. Patent 2,687,670 (1954); K. Antenen, Mikroskopie 11, 129 (1956); Schweiz. Brau. Rundschau 4 (1956).

A. H. Bennett and A. J. Kavanagh, U. S. Patent 2,737,084 (1956); H. Osterberg, U. S. Patent 2,732,759 (1956); A. H. Bennett, U. S. Patent 2,675,737 (1954); L. Leitz, U. S. Patent 2,746,348 (1956).

A. H. Bennett, U. S. Patent 2,655,077 (1953); A. J. Kavanagh, U. S. Patent 2,685,228 (1954); K. Rantsch, U. S. Patent 2,699,092 (1955); D. Gabor, U. S. Patent 2,770,166 (1956).

H. Heine, U. S. Patent 2,674,157 (1954).

Saylor, Brice, and Zernike, J. Opt. Soc. Am. 40, 329 (1950); F. C. Grigg, Nature 165, 368 (1950).

J. Rheinberg, J. Roy. Microscop. Soc. 16, 373 (1896); H. Wolter, Ann. Physik 8, 1 (1950); F. Gabler, Mikroskopie 6, 98 (1951); M. Bayer and J. Meyer-Arendt, Phot. u. Wiss. 4, 19 (1955).

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