Abstract

The measured birefringences of quartz and calcite plates are given at several visible wavelengths for temperatures of 20° and 40°C.

© 1959 Optical Society of America

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References

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  1. B. Lyot, Ann. Astrophys. 7, 31 (1944).
  2. W. P. Davey, A Study of Crystal Structure and Its Applications (McGraw-Hill Book Company, Inc., New York, 1934).
  3. R. B. Sosman, Properties of Silica (Chemical Catalog Company, New York, 1927).
  4. J. W. Gifford, Proc. Roy. Soc. (London) 70, 329 (1902);ibid. A84, 193 (1911).
    [Crossref]
  5. F. F. Martens, Ann. Physik 6, 603 (1901).
    [Crossref]

1944 (1)

B. Lyot, Ann. Astrophys. 7, 31 (1944).

1902 (1)

J. W. Gifford, Proc. Roy. Soc. (London) 70, 329 (1902);ibid. A84, 193 (1911).
[Crossref]

1901 (1)

F. F. Martens, Ann. Physik 6, 603 (1901).
[Crossref]

Davey, W. P.

W. P. Davey, A Study of Crystal Structure and Its Applications (McGraw-Hill Book Company, Inc., New York, 1934).

Gifford, J. W.

J. W. Gifford, Proc. Roy. Soc. (London) 70, 329 (1902);ibid. A84, 193 (1911).
[Crossref]

Lyot, B.

B. Lyot, Ann. Astrophys. 7, 31 (1944).

Martens, F. F.

F. F. Martens, Ann. Physik 6, 603 (1901).
[Crossref]

Sosman, R. B.

R. B. Sosman, Properties of Silica (Chemical Catalog Company, New York, 1927).

Ann. Astrophys. (1)

B. Lyot, Ann. Astrophys. 7, 31 (1944).

Ann. Physik (1)

F. F. Martens, Ann. Physik 6, 603 (1901).
[Crossref]

Proc. Roy. Soc. (London) (1)

J. W. Gifford, Proc. Roy. Soc. (London) 70, 329 (1902);ibid. A84, 193 (1911).
[Crossref]

Other (2)

W. P. Davey, A Study of Crystal Structure and Its Applications (McGraw-Hill Book Company, Inc., New York, 1934).

R. B. Sosman, Properties of Silica (Chemical Catalog Company, New York, 1927).

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Figures (2)

F. 1
F. 1

Interferograms showing nonuniformity of calcite. (a) Interference fringes with double passage of light polarized (left) in plane of ordinary ray, (right) in plane of extraordinary ray. (b) Interference fringes with double passage of the ordinary ray showing the amount of hand figuring required on the worst plate.

F. 2
F. 2

Schematic arrangement for measuring the fractional order of retardation: S1, continuous source; P, polarizer; C, crystal plate in temperature controlled enclosure; S2, line source; F, entrance slit of spectroscope; M, micrometer eyepiece; G, filter isolating monochromatic lines; B, Babinet compensator.

Tables (5)

Tables Icon

Table I Example of computation of integral part of retardations for λ = 5461 A at 20°C.

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Table II Birefringence of quartz.

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Table III Birefringence of calcite—thin plates.

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Table IV Birefringences of calcite—all plates.

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Table V Example of variation of birefringence of calcite for λ = 5461 A (mean birefringence = −0.173753).

Equations (3)

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r = μ t / λ ,
Δ λ λ = 1 r ( λ μ μ λ 1 ) .
1486 1 4