Abstract

Measurements have been made on evaporated thin films of Al, Sn, In, Bi, Au, Ag, and Cd in order to correlate optical transmission, reflection, and photoemission in the far ultraviolet. Thin unbacked films prepared outside the spectrograph and glass-backed films prepared inside the spectrograph were used. The frequency at which the films change from a reflecting medium to a transmitting medium has been compared with the plasma frequency predicted by Bohm and Pines and also with electron energy eigenlosses in metals observed by Marton <i>et al.</i> Some new absorption transitions have been observed and related to x-ray absorption edges. A qualitative correlation between the photoelectric yields and corresponding optical properties has been attempted.

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  1. Marton, Leder, and Mendlowitz, Advances in Electronics and Electron Physics (Academic Press, Inc., New York, 1955), Vol. 7; D. Pines in Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press, Inc., New York, 1955), Vol. 1.
  2. R. W. Wood and C. Lukens, Phys. Rev. 54, 332 (1938); R. W. Wood, Phys. Rev. 44, 353 (1933).
  3. H. E. Ives and H. B. Briggs, J. Opt. Soc. Am. 26, 238 (1936); 27, 181 (1937); 27, 395 (1937).
  4. G. Sabine, Phys. Rev. 55, 1064 (1939); P. R. Gleason, Proc. Am. Acad. Arts Sci. 64, 92 (1930).
  5. Hass, Hunter, and Tousey, J. Opt. Soc. Am. 46, 1009 (1956); 47, 120 (1957); G. Hass and A. P. Bradford, J. Opt. Soc. Am. 47, 125 (1957).
  6. C. Kenty, Phys. Rev. 44, 891 (1933).
  7. H. E. Hinteregger and K. Watanabe, J. Opt. Soc. Am. 43, 604 (1953).
  8. Walker, Wainfan, and Weissler, J. Appl. Phys. 26, 1366 (1955).
  9. D. Bohm and D. Pines, Phys. Rev. 82, 625 (1951); 85, 338 (1952); 92, 609 (1953).
  10. F. E. Carpenter and J. A. Curcio, Rev. Sci. Instr. 21, 675 (1950).
  11. S. Tolansky, Multiple-Beam Interferometry of Surfaces and Films (Clarendon Press, Oxford, 1948).
  12. Leder, Mendlowitz, and Marton, Phys. Rev. 101, 1460 (1956).
  13. L. Marton and L. B. Leder, Phys. Rev. 94, 203 (1954).
  14. D. Pines, Revs. Modern Phys. 28, 184 (1956).
  15. W. Klein, Optik 11, 226 (1954).

Bohm, D.

D. Bohm and D. Pines, Phys. Rev. 82, 625 (1951); 85, 338 (1952); 92, 609 (1953).

Briggs, H. B.

H. E. Ives and H. B. Briggs, J. Opt. Soc. Am. 26, 238 (1936); 27, 181 (1937); 27, 395 (1937).

Carpenter, F. E.

F. E. Carpenter and J. A. Curcio, Rev. Sci. Instr. 21, 675 (1950).

Curcio, J. A.

F. E. Carpenter and J. A. Curcio, Rev. Sci. Instr. 21, 675 (1950).

Hinteregger, H. E.

H. E. Hinteregger and K. Watanabe, J. Opt. Soc. Am. 43, 604 (1953).

Ives, H. E.

H. E. Ives and H. B. Briggs, J. Opt. Soc. Am. 26, 238 (1936); 27, 181 (1937); 27, 395 (1937).

Kenty, C.

C. Kenty, Phys. Rev. 44, 891 (1933).

Klein, W.

W. Klein, Optik 11, 226 (1954).

Leder, L. B.

L. Marton and L. B. Leder, Phys. Rev. 94, 203 (1954).

Lukens, C.

R. W. Wood and C. Lukens, Phys. Rev. 54, 332 (1938); R. W. Wood, Phys. Rev. 44, 353 (1933).

Marton, L.

L. Marton and L. B. Leder, Phys. Rev. 94, 203 (1954).

Pines, D.

D. Bohm and D. Pines, Phys. Rev. 82, 625 (1951); 85, 338 (1952); 92, 609 (1953).

D. Pines, Revs. Modern Phys. 28, 184 (1956).

Sabine, G.

G. Sabine, Phys. Rev. 55, 1064 (1939); P. R. Gleason, Proc. Am. Acad. Arts Sci. 64, 92 (1930).

Tolansky, S.

S. Tolansky, Multiple-Beam Interferometry of Surfaces and Films (Clarendon Press, Oxford, 1948).

Watanabe, K.

H. E. Hinteregger and K. Watanabe, J. Opt. Soc. Am. 43, 604 (1953).

Wood, R. W.

R. W. Wood and C. Lukens, Phys. Rev. 54, 332 (1938); R. W. Wood, Phys. Rev. 44, 353 (1933).

Other

Marton, Leder, and Mendlowitz, Advances in Electronics and Electron Physics (Academic Press, Inc., New York, 1955), Vol. 7; D. Pines in Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press, Inc., New York, 1955), Vol. 1.

R. W. Wood and C. Lukens, Phys. Rev. 54, 332 (1938); R. W. Wood, Phys. Rev. 44, 353 (1933).

H. E. Ives and H. B. Briggs, J. Opt. Soc. Am. 26, 238 (1936); 27, 181 (1937); 27, 395 (1937).

G. Sabine, Phys. Rev. 55, 1064 (1939); P. R. Gleason, Proc. Am. Acad. Arts Sci. 64, 92 (1930).

Hass, Hunter, and Tousey, J. Opt. Soc. Am. 46, 1009 (1956); 47, 120 (1957); G. Hass and A. P. Bradford, J. Opt. Soc. Am. 47, 125 (1957).

C. Kenty, Phys. Rev. 44, 891 (1933).

H. E. Hinteregger and K. Watanabe, J. Opt. Soc. Am. 43, 604 (1953).

Walker, Wainfan, and Weissler, J. Appl. Phys. 26, 1366 (1955).

D. Bohm and D. Pines, Phys. Rev. 82, 625 (1951); 85, 338 (1952); 92, 609 (1953).

F. E. Carpenter and J. A. Curcio, Rev. Sci. Instr. 21, 675 (1950).

S. Tolansky, Multiple-Beam Interferometry of Surfaces and Films (Clarendon Press, Oxford, 1948).

Leder, Mendlowitz, and Marton, Phys. Rev. 101, 1460 (1956).

L. Marton and L. B. Leder, Phys. Rev. 94, 203 (1954).

D. Pines, Revs. Modern Phys. 28, 184 (1956).

W. Klein, Optik 11, 226 (1954).

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