Abstract

An interferometer for the absolute measurement of the length of end standards is described in which the optical path difference introduced between the interfering beams is only half the length of the gauge. This permits the direct measurement of gauge blocks up to 1 meter long with the isotope sources currently available. Other advantages of the instrument are its relatively compact layout and simplicity of operation.

© 1959 Optical Society of America

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References

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  1. F. H. Rolt, Engineering 144, 162 (1937).
  2. W. Kosters, Z. Feinmechanik 34, 55 (1926).
  3. J. H. Dowell, Brit. Patents No. 367,860and 555, 672.
  4. J. J. Hunzinger, Rev. opt. 36, 285 (1957).
  5. C. Candler, Modern Interferometers (Hilger and Watts, London, 1951) p. 202.
  6. K. M. Baird and K. H. Hart, J. Opt. Soc. Am. 46, 304 (1956).
    [CrossRef]

1957 (1)

J. J. Hunzinger, Rev. opt. 36, 285 (1957).

1956 (1)

1937 (1)

F. H. Rolt, Engineering 144, 162 (1937).

1926 (1)

W. Kosters, Z. Feinmechanik 34, 55 (1926).

Baird, K. M.

Candler, C.

C. Candler, Modern Interferometers (Hilger and Watts, London, 1951) p. 202.

Dowell, J. H.

J. H. Dowell, Brit. Patents No. 367,860and 555, 672.

Hart, K. H.

Hunzinger, J. J.

J. J. Hunzinger, Rev. opt. 36, 285 (1957).

Kosters, W.

W. Kosters, Z. Feinmechanik 34, 55 (1926).

Rolt, F. H.

F. H. Rolt, Engineering 144, 162 (1937).

Engineering (1)

F. H. Rolt, Engineering 144, 162 (1937).

J. Opt. Soc. Am. (1)

Rev. opt. (1)

J. J. Hunzinger, Rev. opt. 36, 285 (1957).

Z. Feinmechanik (1)

W. Kosters, Z. Feinmechanik 34, 55 (1926).

Other (2)

J. H. Dowell, Brit. Patents No. 367,860and 555, 672.

C. Candler, Modern Interferometers (Hilger and Watts, London, 1951) p. 202.

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Figures (2)

Fig. 1
Fig. 1

Schematic diagram of the interferometer. L, monochromatic light source; O, pinhole; C, collimator objective; M1, compensated beam divider; M2, M3, semireflecting mirrors; M4, M5, end mirrors; G1G2, gauge block; T, telescope objective; P, exit stop.

Fig. 2
Fig. 2

Appearance of the fringe system seen in the interferometer. The fringes in the central part of the field are formed by interference between the beams from the reference path and the beams reflected from the ends of the gauge, while those in the outer parts of the field are formed by interference between the beams from the reference path and the beams passing around the gauge in the outer path.

Equations (5)

Equations on this page are rendered with MathJax. Learn more.

S 1 = c sin ( 2 π / λ ) ( B - L + 2 Δ ) ,
S 2 = c sin ( 2 π / λ ) ( B - L - 2 Δ ) ,
S = S 1 + S 2 = 2 c cos ( 4 π Δ / λ ) · sin ( 2 π / λ ) ( B - L ) ,
I F = 16 cos 2 π ( B - A ) / λ ,
I G = 4 ( 1 - cos 4 π Δ / λ ) 2 + 16 cos ( 4 π Δ / λ ) · cos 2 π ( B - A - L ) / λ .