Abstract

A triangular path shearing interferometer is described which can be used for the examination of large transparent objects. It has the advantage that it can be conveniently adapted to an existing schlieren system, affording the possibility of quantitative measurements. The additional optical elements required are only of comparatively small aperture and are therefore quite inexpensive.

© 1959 Optical Society of America

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References

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  1. Chevalerias, Latron, and Veret, J. Opt. Soc. Am. 47, 703 (1957).
    [Crossref]
  2. M. Françon, J. OPt. Soc. Am. 47, 528 (1957).
    [Crossref]

1957 (2)

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Figures (2)

F 1
F 1

Schematic diagram of the interferometer. S, light source; P, pinhole; L, lens; M1, compensated beam divider; M2, M3, concave mirrors; F, field lens; E, exit pupil.

F 2
F 2

Fringes obtained with a roughly polished glass plate using the triangular path interferometer. Lateral displacement between the beams: 1 mm.