Abstract

An accessory designed and constructed for use with the Perkin-Elmer double-beam Model 21 spectrophotometer is described, which permits the measurement of spectral emissivities of opaque materials at room temperatures. The measurements made are of total (specular plus diffuse) spectral reflection. From this value the spectral emissivity is obtained by subtraction from one.

The new source consists of a heated enclosure to supply the energy and a twin optical system to lead the respective sample and reference beams into the instrument. Part of this optical system is removable to permit normal operation of the spectrophotometer and replaceable without readjustment. A temperature-controlled water supply is used to cool the sample.

A method for extending the use of this equipment to measure emissivities of materials of low conductivities has been outlined.

© 1959 Optical Society of America

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References

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  1. Gier, Dunkle, and BevansJ. Opt. Soc. Am 41, 419 (1951).
    [Crossref]
  2. February18, 1949, University of California.
  3. Final Report Thermal Radiation Project, September1, 1950, University of California.
  4. June27, 1953, University of California.
  5. A. G. Worthing, J. Appl. Phys 11, 421–437 (1940).
    [Crossref]

1951 (1)

Gier, Dunkle, and BevansJ. Opt. Soc. Am 41, 419 (1951).
[Crossref]

1940 (1)

A. G. Worthing, J. Appl. Phys 11, 421–437 (1940).
[Crossref]

Bevans,

Gier, Dunkle, and BevansJ. Opt. Soc. Am 41, 419 (1951).
[Crossref]

Dunkle,

Gier, Dunkle, and BevansJ. Opt. Soc. Am 41, 419 (1951).
[Crossref]

Gier,

Gier, Dunkle, and BevansJ. Opt. Soc. Am 41, 419 (1951).
[Crossref]

Worthing, A. G.

A. G. Worthing, J. Appl. Phys 11, 421–437 (1940).
[Crossref]

J. Appl. Phys (1)

A. G. Worthing, J. Appl. Phys 11, 421–437 (1940).
[Crossref]

J. Opt. Soc. Am (1)

Gier, Dunkle, and BevansJ. Opt. Soc. Am 41, 419 (1951).
[Crossref]

Other (3)

February18, 1949, University of California.

Final Report Thermal Radiation Project, September1, 1950, University of California.

June27, 1953, University of California.

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Figures (8)

Fig. 1
Fig. 1

Photograph of equipment.

Fig. 2
Fig. 2

Schematic showing arrangement of equipment and paths of radiation.

Fig. 3
Fig. 3

Cross section of heated enclosure.

Fig. 4
Fig. 4

Reflectance of a high reflector, aluminum.

Fig. 5
Fig. 5

Reflectance of a poor reflector on enhanced scale.

Fig. 6
Fig. 6

Reflectance of white paint with and without screen in reference beam.

Fig. 7
Fig. 7

Reflectance of thick sample of poor conductor with screen in reference beam (see text for details).

Fig. 8
Fig. 8

Effect of cooling water temperature on reflectance of black paint with screen in reference beam. (Scale multiplied by three.)

Equations (1)

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e = 1 - r t .