Abstract

The development of sharpened fringes in long path length interferometers (like the Twyman-Green, Mach-Zehnder, and series) by intensity and by multiple reflection is described. The cause of the extreme localization of some of the multiple-reflection fringe patterns is discussed.

© 1958 Optical Society of America

Multiple-Beam Fringe Sharpening with the Series Interferometer

Daniel Post
J. Opt. Soc. Am. 48(5) 309-312 (1958)

Fizeau Interferometer–Fringe Sharpening

P. Langenbeck
Appl. Opt. 9(9) 2053-2058 (1970)

Interference Fringes with Cylindrically Curved Thin Films

N. Barakat
J. Opt. Soc. Am. 48(2) 92-94 (1958)

Multiple-Beam Fringes of Equal Chromatic Order. Part VIII. Method of Coincidence

W. F. Koehler
J. Opt. Soc. Am. 48(1) 55-57 (1958)

Analysis of Interference Fringes from a Flame*

Boyd W. Harned and N. Ginsburg
J. Opt. Soc. Am. 48(3) 178-183 (1958)